Manoj Sachdev - Böcker

Thermal and Power Management of Integrated Circuits

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

ESD Protection Device and Circuit Design for Advanced CMOS Technologies

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies

Process-Aware SRAM Design and Test

Thermal and Power Management of Integrated Circuits

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

ESD Protection Device and Circuit Design for Advanced CMOS Technologies