José Pineda de Gyvez - Böcker

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

Integrated Circuit Manufacturability

The Art of Process and Design Integration

Integrated Circuit Defect-Sensitivity: Theory and Computational Models

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

Integrated Circuit Defect-Sensitivity: Theory and Computational Models

Low-Power High-Resolution Analog to Digital Converters

Design, Test and Calibration