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José Pineda de Gyvez – författare

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7 produkter
Manoj Sachdev, José Pineda de Gyvez - Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits, Inbunden
Del 34 - Frontiers in Electronic Testing

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

AvManoj Sachdev,José Pineda de Gyvez

Inbunden, Engelska, 2007

2 789 kr

Skickas inom 10-15 vardagar

José Pineda de Gyvez, Dhiraj Pradhan - Integrated Circuit Manufacturability, Inbunden

3 629 kr

Skickas inom 5-8 vardagar

José Pineda de Gyvez - Integrated Circuit Defect-Sensitivity: Theory and Computational Models, Inbunden

1 399 kr

Skickas inom 10-15 vardagar

Manoj Sachdev, José Pineda de Gyvez - Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits, Häftad
Del 34 - Frontiers in Electronic Testing

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

AvManoj Sachdev,José Pineda de Gyvez

Häftad, Engelska, 2010

2 689 kr

Skickas inom 5-8 vardagar

José Pineda de Gyvez - Integrated Circuit Defect-Sensitivity: Theory and Computational Models, Häftad
Del 208 - Springer International Series in Engineering and Computer Science

Integrated Circuit Defect-Sensitivity: Theory and Computational Models

AvJosé Pineda de Gyvez

Häftad, Engelska, 2014

1 399 kr

Skickas inom 10-15 vardagar

Amir Zjajo, José Pineda de Gyvez - Low-Power High-Resolution Analog to Digital Converters, Inbunden

709 kr

Skickas inom 10-15 vardagar

Amir Zjajo, José Pineda de Gyvez - Low-Power High-Resolution Analog to Digital Converters, Häftad

709 kr

Skickas inom 10-15 vardagar