Del i serien Frontiers in Electronic Testing
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
Process-Aware SRAM Design and Test
Häftad, Engelska, 2010
2 289 kr
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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of topics related to SRAM design and test. From SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing. The emphasis of the book is on challenges and solutions of stability testing as well as on development of understanding of the link between the process technology and SRAM circuit design in modern nano-scaled technologies.
Produktinformation
- Utgivningsdatum2010-10-28
- Mått155 x 235 x 12 mm
- Vikt330 g
- FormatHäftad
- SpråkEngelska
- SerieFrontiers in Electronic Testing
- Antal sidor194
- FörlagSpringer
- ISBN9789048178551
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