Del i serien Frontiers in Electronic Testing
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
Process-Aware SRAM Design and Test
Inbunden, Engelska, 2008
2 289 kr
Beställningsvara. Skickas inom 10-15 vardagar. Fri frakt för medlemmar vid köp för minst 249 kr.
Finns i fler format (1)
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of topics related to SRAM design and test. From SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing. The emphasis of the book is on challenges and solutions of stability testing as well as on development of understanding of the link between the process technology and SRAM circuit design in modern nano-scaled technologies.
Produktinformation
- Utgivningsdatum2008-06-21
- Mått155 x 235 x 19 mm
- Vikt445 g
- FormatInbunden
- SpråkEngelska
- SerieFrontiers in Electronic Testing
- Antal sidor194
- Upplaga2008
- FörlagSpringer-Verlag New York Inc.
- ISBN9781402083624
Tillhör följande kategorier
Hoppa över listan
Mer från samma serie
Del 31
Fault Diagnosis of Analog Integrated Circuits
Prithviraj Kabisatpathy, Alok Barua, Satyabroto Sinha
Inbunden, 2005
1 439 kr
Fault-Tolerance Techniques for SRAM-Based FPGAs
Fernanda Lima Kastensmidt, Ricardo Reis
Inbunden, 2006
1 439 kr
Del 34
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Manoj Sachdev, José Pineda de Gyvez
Inbunden, 2007
2 859 kr
Del 37
Del 17
Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits
M. Bushnell, Vishwani Agrawal
Inbunden, 2000
1 869 kr
Hoppa över listan
Du kanske också är intresserad av
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
Andrei Pavlov, Manoj Sachdev
Häftad, 2010
2 289 kr
Del 34
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Manoj Sachdev, José Pineda de Gyvez
Inbunden, 2007
2 859 kr
ESD Protection Device and Circuit Design for Advanced CMOS Technologies
Oleg Semenov, Hossein Sarbishaei, Manoj Sachdev
Inbunden, 2008
2 439 kr
Del 34
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Manoj Sachdev, José Pineda de Gyvez
Häftad, 2010
2 709 kr
Thermal and Power Management of Integrated Circuits
Arman Vassighi, Manoj Sachdev
Inbunden, 2006
1 439 kr
ESD Protection Device and Circuit Design for Advanced CMOS Technologies
Oleg Semenov, Hossein Sarbishaei, Manoj Sachdev
Häftad, 2010
2 439 kr
Thermal and Power Management of Integrated Circuits
Arman Vassighi, Manoj Sachdev
Häftad, 2010
1 439 kr
- Nyhet
Del 3