Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science
Sarah Fearn
Häftad, 2015
779 kr
Del i serien IOP ebooks
Secondary Ion Mass Spectrometry and Its Application to Materials Science (Second Edition)
Inbunden, Engelska, 2025
1 469 kr
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Produktinformation
- Utgivningsdatum2025-08-26
- Mått178 x 254 x 8 mm
- Vikt418 g
- FormatInbunden
- SpråkEngelska
- SerieIOP ebooks
- Antal sidor112
- Upplaga2
- FörlagInstitute of Physics Publishing
- ISBN9780750333290
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