Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science 1
bokomslag Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science
Vetenskap & teknik

Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science

Sarah Fearn

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2159:-

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Andra format:

  • 66 sidor
  • 2015
  • Författare: Sarah Fearn
  • Format: Inbunden
  • ISBN: 9781643279107
  • Språk: Engelska
  • Antal sidor: 66
  • Utgivningsdatum: 2015-10-16
  • Förlag: Morgan & Claypool Publishers

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