Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science 1
bokomslag Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science
Vetenskap & teknik

Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science

Sarah Fearn

Pocket

679:-

Funktionen begränsas av dina webbläsarinställningar (t.ex. privat läge).

Uppskattad leveranstid 5-10 arbetsdagar

Fri frakt för medlemmar vid köp för minst 249:-

Andra format:

  • 66 sidor
  • 2015
  • Författare: Sarah Fearn
  • Format: Pocket/Paperback
  • ISBN: 9781681740249
  • Språk: Engelska
  • Antal sidor: 66
  • Utgivningsdatum: 2015-10-16
  • Förlag: Morgan & Claypool Publishers

Du kanske gillar

  1. bokomslag Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science

    Introduction to Time-of-Flight Second...

    Sarah Fearn

    Inbunden

    2209:-
  2. bokomslag Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science

    Introduction to Time-of-Flight Second...

    Sarah Fearn

    Pocket

    759:-
  3. bokomslag Characterizing a Neutron Energy Spectrum Using a "Forward Edge" Neutron Time-of-Flight Spectroscopy Technique

    Characterizing a Neutron Energy Spect...

    Jeffrey S Spear Jeffrey S Spear

    Klotband

    449:-
  4. bokomslag Improved Analysis of DNA Short Tandem Repeats With Time-of-Flight Mass Spectrometry

    Improved Analysis of DNA Short Tandem...

    U S Department Of Justice

    Häftad

    359:-
  5. bokomslag Improved Analysis of DNA Short Tandem Repeats With Time-of-Flight Mass Spectrometry

    Improved Analysis of DNA Short Tandem...

    U S Department Of Justice Christopher...

    Häftad

    279:-
  6. bokomslag Dynamic 3D Scene Analysis and Modeling with a Time-of-Flight Camera

    Dynamic 3D Scene Analysis and Modelin...

    Ingo Schiller

    Pocket

    389:-
  7. bokomslag Imaging Industrial Flows

    Imaging Industrial Flows

    A Plaskowski, M S Beck, R Thorn, Tom Dyakowski, M S Beck

    Inbunden

    4659:-
  8. bokomslag High Pressure Experimental Methods

    High Pressure Experimental Methods

    M I Eremets M I Eremets

    Inbunden

    5119:-
  9. bokomslag Introduction to Focused Ion Beam Nanometrology

    Introduction to Focused Ion Beam Nano...

    David C Cox

    Pocket

    1789:-
  10. bokomslag Time-of-Flight Cameras and Microsoft Kinect?

    Time-of-Flight Cameras and Microsoft ...

    Carlo Dal Mutto, Pietro Zanuttigh, Guido M Cortelazzo

    Pocket

    709:-

Andra av samma författare

  1. Ny
    bokomslag Secondary Ion Mass Spectrometry and Its Application to Materials Science (Second Edition)

    Secondary Ion Mass Spectrometry and I...

    Sarah Fearn, Alexander Shard, Sarah Fearn, Alexander Shard

    Inbunden

    1459:-
  2. Ny
    bokomslag Secondary Ion Mass Spectrometry and Its Application to Materials Science (Second Edition)

    Secondary Ion Mass Spectrometry and I...

    Alexander Shard Sarah Fearn

    Pocket

    449:-