Patrick Girard - Böcker

Logic in the Wild

Logician's Code of Conduct

Power-Aware Testing and Test Strategies for Low Power Devices

Advanced Test Methods for SRAMs

Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

Power-Aware Testing and Test Strategies for Low Power Devices

Advanced Test Methods for SRAMs

Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

Machine Learning Support for Fault Diagnosis of System-on-Chip

Machine Learning Support for Fault Diagnosis of System-on-Chip

Dynamic Formal Epistemology