Bashir M, Al-Hashimi - Böcker

System-on-Chip

Next generation electronics

Microplastics in the Environment

Fate, Impacts, Removal, and Management

PFAS in the Environment

Occurrence, Characterization, Treatment, and Management

Power-Constrained Testing of VLSI Circuits

A Guide to the IEEE 1149.4 Test Standard

System-Level Design Techniques for Energy-Efficient Embedded Systems

Power-Constrained Testing of VLSI Circuits

A Guide to the IEEE 1149.4 Test Standard

System-Level Design Techniques for Energy-Efficient Embedded Systems