Jaan Raik - Böcker

Design and Test Technology for Dependable Systems-on-Chip

Structural Decision Diagrams in Digital Test

Theory and Applications

Structural Decision Diagrams in Digital Test

Theory and Applications

VLSI-SoC: System-on-Chip in the Nanoscale Era – Design, Verification and Reliability

24th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2016, Tallinn, Estonia, September 26-28, 2016, Revised Selected Papers