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Del 12

Alvin W. Strong, Ernest Y. Wu, Rolf-Peter Vollertsen, Jordi Sune, Giuseppe La Rosa, Timothy D. Sullivan, Stewart E. Rauch III - Reliability Wearout Mechanisms in Advanced CMOS Technologies, Inbunden

Del 12 - IEEE Press Series on Microelectronic Systems

Reliability Wearout Mechanisms in Advanced CMOS Technologies

AvAlvin W. Strong,Ernest Y. Wum. fl.

Inbunden, Engelska, 2009

2 869 kr

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