Stanley L. Hurst began his industrial career with Westinghouse Brake and Signal Company before leaving for academia in the 1960s. Initially with the Bristol College of Science and Technology and subsequently with the University of Bath, he specialised in digital electronic teaching and research, particularly in custom microelectronics and testing. In 1985 he was recruited by the Open University to produce educational material on these subjects for industry and continuing education courses. He is currently Academic Editor, Circuits and Systems, of the Microelectronics Journal. He holds the MSc(Eng) and PhD from the University of London, the DSc from the University of Bath, and is the author of some 50 papers and eight books in his subject area.

• Chapter 1: IntroductionChapter 2: Faults in digital circuitsChapter 3: Digital test pattern generationChapter 4: Signatures and self testChapter 5: Structured design for testability (DFT) techniquesChapter 6: Testing of structured digital circuits and microprocessorsChapter 7: Analogue testingChapter 8: Mixed analogue/digital system testChapter 9: The economics of test and final overall summaryAppendices

'The book covers the important aspects of VLSI testing, introduces a significant number of testing methods and strategies and is a valuable book on VLSI testing.'