Del 0 - Frontiers in Electronic Testing

Soft Errors in Modern Electronic Systems

Inbunden, Engelska, 2010

2 219 kr

Beställningsvara. Skickas inom 10-15 vardagar. Fri frakt för medlemmar vid köp för minst 249 kr.

Provides a comprehensive presentation of the research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physical mechanisms of radiation induced soft errors, the various steps that lead to a system failure, and more.

Produktinformation

Utgivningsdatum2010-09-30
Mått155 x 235 x 28 mm
Vikt647 g
FormatInbunden
SpråkEngelska
SerieFrontiers in Electronic Testing
Antal sidor318
Upplaga2011
FörlagSpringer-Verlag New York Inc.
ISBN9781441969927

Tillhör följande kategorier

Systemvetenskap och AI inom Data och IT
Energiteknik inom Naturvetenskap och teknik
Hårdvara inom Data och IT
Elektronik och kommunikationer inom Naturvetenskap och teknik

Soft Errors from Space to Ground: Historical Overview, Empirical Evidence, and Future Trends.- Radiation Induced Single-Event Effects: Physical Mechanisms and Classification.- JEDEC Standard on Measurement and Reporting of Alpha Particles and Terrestrial Cosmic Ray-Induced Soft Errors.- Cell-Level Modelling and Simulation.- Circuit and System Level Modelling and Simulation.- Hardware Fault Injection.- Accelerated Radiation Testing for Space Applications.- Testing for Ground-Level Applications.- Soft Error Mitigation Techniques.- Convergence of Mitigation Techniques for Soft Errors and Other Reliability Issues and Power Aware Mitigation Techniques.- Software Level Soft-Error Mitigation Techniques.- System Level Soft-Error Mitigation Techniques.