Inbunden, Engelska, 2002
Semiconductor Memories
Technology, Testing, and Reliability
3429 kr
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Beskrivning
Semiconductor Memories provides in-depth coverage in the areas of design for testing, fault tolerance, failure modes and mechanisms, and screening and qualification methods including.* Memory cell structures and fabrication technologies.* Application-specific memories and architectures.* Memory design, fault modeling and test algorithms, limitations, and trade-offs.* Space environment, radiation hardening process and design techniques, and radiation testing.* Memory stacks and multichip modules for gigabyte storage.
Produktinformation
- Utgivningsdatum: 2002-09-10
- Mått: 183 x 257 x 33 mm
- Vikt: 1 043 g
- Format: Inbunden
- Språk: Engelska
- Antal sidor: 480
- Förlag: John Wiley & Sons Inc
- ISBN: 9780780310001
Utforska kategorier
Mer information
ASHOK K. SHARMA is the author of Semiconductor Memories: Technology, Testing, and Reliability. He is currently working as a reliability engineering manager at NASA, Goddard Space Flight Center, Greenbelt, Maryland.
Recensioner i media
"...a valuable reference..." (Microelectronics Reliability, Vol. 43, 2003)
Butikslager
Ej i lager i butik.
Betyg & recensioner
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