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Discussing the structure and evolution of the self-trapped exciton (STE) in a range of materials, this work includes a comprehensive review of experiments and extensive tables of data. Emphasis is given throughout to the unity of the basic physics underlying various manifestations of self-trapping, with the theory being developed from a localized, atomistic perspective. The topics treated in detail in relation to STE relaxation include spontaneous symmetry breaking, lattice defect formation, radiation damage and electronic sputtering.
- Format: Pocket/Paperback
- ISBN: 9783540604464
- Språk: Engelska
- Antal sidor: 410
- Utgivningsdatum: 1996-03-18
- Förlag: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG