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Leung Tsang, Jin Au Kong - Scattering of Electromagnetic Waves, Inbunden

Inbunden, Engelska, 2001

Del 17 i serien Wiley Series in Remote Sensing and Image Processing

Scattering of Electromagnetic Waves

Advanced Topics

Av Leung Tsang, Jin Au Kong

3019 kr

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Beskrivning
A timely and authoritative guide to the state of the art of wave scatteringScattering of Electromagnetic Waves offers in three volumes a complete and up-to-date treatment of wave scattering by random discrete scatterers and rough surfaces. Written by leading scientists who have made important contributions to wave scattering over three decades, this new work explains the principles, methods, and applications of this rapidly expanding, interdisciplinary field. It covers both introductory and advanced material and provides students and researchers in remote sensing as well as imaging, optics, and electromagnetic theory with a one-stop reference to a wealth of current research results. Plus, Scattering of Electromagnetic Waves contains detailed discussions of both analytical and numerical methods, including cutting-edge techniques for the recovery of earth/land parametric information.The three volumes are entitled respectively Theories and Applications, Numerical Simulation, and Advanced Topics. In the third volume, Advanced Topics, Leung Tsang (University of Washington) and Jin Au Kong (MIT), cover:* Two-dimensional random rough surface scattering* Kirchhoff and related methods for rough surface scattering* Analytic theory of volume scattering based on cascading of layers* Analytic wave theory for medium with permittivity fluctuations* Multiple scattering theory for discrete scatterers* Quasicrystalline approximation in dense media scattering* Dense media scattering* Backscattering enhancement
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Leung Tsang is the author of Scattering of Electromagnetic Waves: Advanced Topics, published by Wiley. Jin Au Kong was an American expert in applied electromagnetics. He was a 74th-generation lineal descendent of the famous Chinese philosopher Confucius.

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"Here they [the authors] delve deeper into the topics raised in the first two volumes..." (SciTech Book News, Vol. 25, No. 3, September 2001)

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