Scanning Probe Microscopy of Functional Materials

Nanoscale Imaging and Spectroscopy

Häftad, Engelska, 2016

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The goal of this book is to provide a general overview of the rapidly developing field of novel scanning probe microscopy (SPM) techniques for characterization of a wide range of functional materials, including complex oxides, biopolymers, and semiconductors.

Produktinformation

Utgivningsdatum2016-08-23
Mått155 x 235 x 31 mm
Vikt861 g
FormatHäftad
SpråkEngelska
Antal sidor555
FörlagSpringer-Verlag New York Inc.
ISBN9781493939473

Tillhör följande kategorier

Maskinteknik och material inom Naturvetenskap och teknik

I. Emergent phenomena in strongly-correlated systems: Phase separation and novel quaziparticles in nanowires.- STM of ruthenates and manganites.- STM of superconductors.- STM of cuprates.- II. Semiconductor and photovoltaic materials: SPM of solar materials.- Cross-sectional STM of semiconductor heterostructures.- Charge dynamics in photovoltaic polymers.- III. Functional probing of biosystems and macromolecules: Molecular Imaging of biomembranes single molecules with electrically functionalized probes.- AFM/patch clamp in biology.- Electrical imaging of membranes.- Cell dynamics by Ion conductance microscopy.- Ferroelectric polymers.- IV. SPM of magnetic materials: Spin manipulation by STM.- Magnetic Resonant Force Microscopy.- Magnetic Force Microscopy.- V. Electromechanics on the nanoscale: ferroelectrics and multiferroics: New dynamic modes and energy dissipation in SPM.- Polarization dynamics in relaxor ferroelectrics.- Piezoresponse Force Spectroscopy.- Polarization dynamics in capacitors and heterostructures.- VI. Mechanical properties: Nanomechanics by SPM.- Atomic Force Acoustic Microscopy of functional materials.- VII. Optical methods: NSOM and NSOM-transport.- NSOM.- Optical machines and unfolding.- Optically-assisted pump-probe STM.- VIII. Emerging SPM applications: STM/NC-AFM.- Scanning Non-linear Dielectric Microscopy.- Vibrational spectroscopy of single molecule.- Ultrafast ac STM.- SPM and electron microscopy combined.- In-situ STEM-nanoindentation.- Material characterization by SPM-focused X-ray combination.-*see Long ToC for tentative contributors.