Miloš Stanisavljevic received the M.S. degree in electrical engineering fromthe Faculty of Electrical Engineering, University of Belgrade, Belgrade, Serbia,in 2004, and the Ph.D. degree in electrical engineering from the Swiss FederalInstitute of Technology (EPFL), Lausanne, Switzerland, in 2009. During2004, he was an Analog Design and Layout Engineer for Elsys Design, Belgrade/Texas Instruments, Nice. In the end of 2004, he joined MicroelectronicSystems Laboratory, EPFL, as a Research Assistant. During 2006, he waswith International Business Machines Corporation (IBM) Research, Zurich,for six months, where he was involved in the project related to reliability emulationin the state-of-the-art nanoscale CMOS technology. He is currentlyengaged in the field of reliability and fault-tolerant design of nanometer-scalesystems. His current research interests include mixed-signal gate and systemlevel design, reliability evaluation, and optimization. Dr. Stanisavljevic receiveda Scholarship for Students with Extraordinary Results Awarded bythe Serbian Ministry of Education from 1996 to 2004.Alexandre Schmid received the M.S. degree in Microengineering and thePh.D. degree in Electrical Engineering from the Swiss Federal Institute ofTechnology (EPFL) in 1994 and 2000, respectively. He has been with theEPFL since 1994, working at the Integrated Systems Laboratory as a researchand teaching assistant, and at the Electronics Laboratories as a post-doctoralfellow. He joined the Microelectronic Systems Laboratory in 2002 as a SeniorResearch Associate, where he has been conducting research in the fields ofnon-conventional signal processing hardware, nanoelectronic reliability, bioelectronicand brain-machine interfaces. Dr. Schmid has published over 70peer-reviewed journal and conference papers. He has served in the conferencecommittee of The International Conference on Nano-Networks since 2006, astechnical program chair in 2008, and general chair in 2009.Dr. Schmid is anAssociate Editor of the IEICE ELEX. Dr. Schmid is also teaching at the Microengineeringand Electrical Engineering Departments/Sections of EPFL.Yusuf Leblebici received his B.Sc. and M.Sc. degrees in electrical engineeringfrom Istanbul Technical University, in 1984 and in 1986, respectively, andhis Ph.D. degree in electrical and computer engineering from the Universityof Illinois at Urbana-Champaign (UIUC) in 1990. Between 1991 and 2001,he worked as a faculty member at UIUC, at Istanbul Technical University,and at Worcester Polytechnic Institute (WPI). In 2000-2001, he also servedas the Microelectronics Program Coordinator at Sabanci University.Since 2002, Dr. Leblebici has been a Chair Professor at the Swiss FederalInstitute of Technology in Lausanne (EPFL), and director of MicroelectronicSystems Laboratory. His research interests include design of high-speedCMOS digital and mixed-signal integrated circuits, computer-aided design ofVLSI systems, intelligent sensor interfaces, modeling and simulation of semiconductordevices, and VLSI reliability analysis.He is the coauthor of 4 textbooks, namely, Hot-Carrier Reliability of MOSVLSI Circuits (Kluwer Academic Publishers, 1993), CMOS Digital IntegratedCircuits: Analysis and Design (McGraw Hill, 1st Edition 1996, 2nd Edition1998, 3rd Edition 2002), CMOS Multichannel Single-Chip Receivers forMulti-Gigabit Optical Data Communications (Springer, 2007) and Fundamentalsof High Frequency CMOS Analog Integrated Circuits (CambridgeUniversity Press, 2009), as well as more than 200 articles published in variousjournals and conferences.He has served as an Associate Editor of IEEE Transactions on Circuits andSystems (II), and IEEE Transactions on Very Large Scale Integrated (VLSI)Systems. He has also served as the general co-chair of the 2006 EuropeanSolid-State Circuits Conference, and the 2006 European Solid State DeviceResearch Conference (ESSCIRC/ESSDERC). He is a Fellow of IEEE andhas been elected as Distinguished Lecturer of the IEEE Circuits and SystemsSociety for 2010-2011.

• Introduction.- Reliability, Faults and Fault Models.- Nanotechnology and Nanodevices.- Fault-Tolerant Architectures and Approaches.- Reliability Evaluation Techniques.- Averaging Design Implementations.- Statistical Evaluation of Fault-Tolerance Using Proability Density Functions.- System Level Reliability Evaluation and Optimization.- Summary and Conclusions.- References.

Miloš Stanisavljevic received the M.S. degree in electrical engineering fromthe Faculty of Electrical Engineering, University of Belgrade, Belgrade, Serbia,in 2004, and the Ph.D. degree in electrical engineering from the Swiss FederalInstitute of Technology (EPFL), Lausanne, Switzerland, in 2009. During2004, he was an Analog Design and Layout Engineer for Elsys Design, Belgrade/Texas Instruments, Nice. In the end of 2004, he joined MicroelectronicSystems Laboratory, EPFL, as a Research Assistant. During 2006, he waswith International Business Machines Corporation (IBM) Research, Zurich,for six months, where he was involved in the project related to reliability emulationin the state-of-the-art nanoscale CMOS technology. He is currentlyengaged in the field of reliability and fault-tolerant design of nanometer-scalesystems. His current research interests include mixed-signal gate and systemlevel design, reliability evaluation, and optimization. Dr. Stanisavljevic receiveda Scholarship for Students with Extraordinary Results Awarded bythe Serbian Ministry of Education from 1996 to 2004.Alexandre Schmid received the M.S. degree in Microengineering and thePh.D. degree in Electrical Engineering from the Swiss Federal Institute ofTechnology (EPFL) in 1994 and 2000, respectively. He has been with theEPFL since 1994, working at the Integrated Systems Laboratory as a researchand teaching assistant, and at the Electronics Laboratories as a post-doctoralfellow. He joined the Microelectronic Systems Laboratory in 2002 as a SeniorResearch Associate, where he has been conducting research in the fields ofnon-conventional signal processing hardware, nanoelectronic reliability, bioelectronicand brain-machine interfaces. Dr. Schmid has published over 70peer-reviewed journal and conference papers. He has served in the conferencecommittee of The International Conference on Nano-Networks since 2006, astechnical program chair in 2008, and general chair in 2009.Dr. Schmid is anAssociate Editor of the IEICE ELEX. Dr. Schmid is also teaching at the Microengineeringand Electrical Engineering Departments/Sections of EPFL.Yusuf Leblebici received his B.Sc. and M.Sc. degrees in electrical engineeringfrom Istanbul Technical University, in 1984 and in 1986, respectively, andhis Ph.D. degree in electrical and computer engineering from the Universityof Illinois at Urbana-Champaign (UIUC) in 1990. Between 1991 and 2001,he worked as a faculty member at UIUC, at Istanbul Technical University,and at Worcester Polytechnic Institute (WPI). In 2000-2001, he also servedas the Microelectronics Program Coordinator at Sabanci University.Since 2002, Dr. Leblebici has been a Chair Professor at the Swiss FederalInstitute of Technology in Lausanne (EPFL), and director of MicroelectronicSystems Laboratory. His research interests include design of high-speedCMOS digital and mixed-signal integrated circuits, computer-aided design ofVLSI systems, intelligent sensor interfaces, modeling and simulation of semiconductordevices, and VLSI reliability analysis.He is the coauthor of 4 textbooks, namely, Hot-Carrier Reliability of MOSVLSI Circuits (Kluwer Academic Publishers, 1993), CMOS Digital IntegratedCircuits: Analysis and Design (McGraw Hill, 1st Edition 1996, 2nd Edition1998, 3rd Edition 2002), CMOS Multichannel Single-Chip Receivers forMulti-Gigabit Optical Data Communications (Springer, 2007) and Fundamentalsof High Frequency CMOS Analog Integrated Circuits (CambridgeUniversity Press, 2009), as well as more than 200 articles published in variousjournals and conferences.He has served as an Associate Editor of IEEE Transactions on Circuits andSystems (II), and IEEE Transactions on Very Large Scale Integrated (VLSI)Systems. He has also served as the general co-chair of the 2006 EuropeanSolid-State Circuits Conference, and the 2006 European Solid State DeviceResearch Conference (ESSCIRC/ESSDERC). He is a Fellow of IEEE andhas been elected as Distinguished Lecturer of the IEEE Circuits and SystemsSociety for 2010-2011.

• Introduction.- Reliability, Faults and Fault Models.- Nanotechnology and Nanodevices.- Fault-Tolerant Architectures and Approaches.- Reliability Evaluation Techniques.- Averaging Design Implementations.- Statistical Evaluation of Fault-Tolerance Using Proability Density Functions.- System Level Reliability Evaluation and Optimization.- Summary and Conclusions.- References.

Miloš Stanisavljevic received the M.S. degree in electrical engineering fromthe Faculty of Electrical Engineering, University of Belgrade, Belgrade, Serbia,in 2004, and the Ph.D. degree in electrical engineering from the Swiss FederalInstitute of Technology (EPFL), Lausanne, Switzerland, in 2009. During2004, he was an Analog Design and Layout Engineer for Elsys Design, Belgrade/Texas Instruments, Nice. In the end of 2004, he joined MicroelectronicSystems Laboratory, EPFL, as a Research Assistant. During 2006, he waswith International Business Machines Corporation (IBM) Research, Zurich,for six months, where he was involved in the project related to reliability emulationin the state-of-the-art nanoscale CMOS technology. He is currentlyengaged in the field of reliability and fault-tolerant design of nanometer-scalesystems. His current research interests include mixed-signal gate and systemlevel design, reliability evaluation, and optimization. Dr. Stanisavljevic receiveda Scholarship for Students with Extraordinary Results Awarded bythe Serbian Ministry of Education from 1996 to 2004.Alexandre Schmid received the M.S. degree in Microengineering and thePh.D. degree in Electrical Engineering from the Swiss Federal Institute ofTechnology (EPFL) in 1994 and 2000, respectively. He has been with theEPFL since 1994, working at the Integrated Systems Laboratory as a researchand teaching assistant, and at the Electronics Laboratories as a post-doctoralfellow. He joined the Microelectronic Systems Laboratory in 2002 as a SeniorResearch Associate, where he has been conducting research in the fields ofnon-conventional signal processing hardware, nanoelectronic reliability, bioelectronicand brain-machine interfaces. Dr. Schmid has published over 70peer-reviewed journal and conference papers. He has served in the conferencecommittee of The International Conference on Nano-Networks since 2006, astechnical program chair in 2008, and general chair in 2009.Dr. Schmid is anAssociate Editor of the IEICE ELEX. Dr. Schmid is also teaching at the Microengineeringand Electrical Engineering Departments/Sections of EPFL.Yusuf Leblebici received his B.Sc. and M.Sc. degrees in electrical engineeringfrom Istanbul Technical University, in 1984 and in 1986, respectively, andhis Ph.D. degree in electrical and computer engineering from the Universityof Illinois at Urbana-Champaign (UIUC) in 1990. Between 1991 and 2001,he worked as a faculty member at UIUC, at Istanbul Technical University,and at Worcester Polytechnic Institute (WPI). In 2000-2001, he also servedas the Microelectronics Program Coordinator at Sabanci University.Since 2002, Dr. Leblebici has been a Chair Professor at the Swiss FederalInstitute of Technology in Lausanne (EPFL), and director of MicroelectronicSystems Laboratory. His research interests include design of high-speedCMOS digital and mixed-signal integrated circuits, computer-aided design ofVLSI systems, intelligent sensor interfaces, modeling and simulation of semiconductordevices, and VLSI reliability analysis.He is the coauthor of 4 textbooks, namely, Hot-Carrier Reliability of MOSVLSI Circuits (Kluwer Academic Publishers, 1993), CMOS Digital IntegratedCircuits: Analysis and Design (McGraw Hill, 1st Edition 1996, 2nd Edition1998, 3rd Edition 2002), CMOS Multichannel Single-Chip Receivers forMulti-Gigabit Optical Data Communications (Springer, 2007) and Fundamentalsof High Frequency CMOS Analog Integrated Circuits (CambridgeUniversity Press, 2009), as well as more than 200 articles published in variousjournals and conferences.He has served as an Associate Editor of IEEE Transactions on Circuits andSystems (II), and IEEE Transactions on Very Large Scale Integrated (VLSI)Systems. He has also served as the general co-chair of the 2006 EuropeanSolid-State Circuits Conference, and the 2006 European Solid State DeviceResearch Conference (ESSCIRC/ESSDERC). He is a Fellow of IEEE andhas been elected as Distinguished Lecturer of the IEEE Circuits and SystemsSociety for 2010-2011.

• Introduction.- Reliability, Faults and Fault Models.- Nanotechnology and Nanodevices.- Fault-Tolerant Architectures and Approaches.- Reliability Evaluation Techniques.- Averaging Design Implementations.- Statistical Evaluation of Fault-Tolerance Using Proability Density Functions.- System Level Reliability Evaluation and Optimization.- Summary and Conclusions.- References.