Realizing Complex Integrated Systems

Anthony P. Ambler is a fellow of the IEEE, elected ‘For contributions to economics of testing complex digital devices and systems’. His research interests are in test economics, system test, and diagnosis. He received his B.Sc., M.Sc., and Ph.D. from the University of Manchester Institute of Science and Technology. He was appointed to a chair in Test Technology at Brunel University (UK) and then moved to the USA. He became chairman of Electrical & Computer Engineering at the University of Texas at Austin, then dean of Engineering & Computing at the University of South Carolina, and recently as dean of Technology at the University of Houston. In addition to his research work, he created the MS degree program in Engineering Management at UT Austin. He has acted as chair of the Organizing Committee of the European Design and Test Conference, general chair and program chair of IEEE International Test Conference and of IEEE International Conference on Computer Design. He has created a number of Workshops including on Test Economics, System Test and Diagnosis, and Production Test Automation.John W. Sheppard is a Norm Asbjornson College of Engineering Distinguished Professor in the Gianforte School of Computing at Montana State University. His research interests include fault diagnosis/prognosis of complex systems, model‑based and Bayesian reasoning, explainable and ethical artificial intelligence, and distributed population‑based algorithms. He is a fellow of the IEEE, elected 'For contributions to system‑level diagnosis and prognosis'. He received his BS in computer science from Southern Methodist University and his MS and PhD in computer science from Johns Hopkins University. Before entering academia full‑time, he was a member of the industry for 20 years where his prior position was as a research fellow at ARINC Incorporated. He has been a long‑time leader in the IEEE Standards Association, chairing several working groups focused on publishing standards related to complex system test and diagnosis. Previously, he also served as the designated representative from the IEEE Computer Society to the IEEE Standards Coordinating Committee 20 on Test and Diagnosis for Electronic Systems.

• 1. An Overview of Complex System Design. PART 1 System Planning 2. Requirements Types – Design and Test. 3. Project Planning. 4. System Decomposition. 5. Systems Engineering Vee. 6. Economics of Design and Test. 7. Cyber-Physical Systems. 8. Logistics and Supply Chain Management. PART 2 System Design 9. Chip Level Design and Test. 10. Board-Level Design and Test. 11. Power Distribution. 12. Design Patterns and Reusability. 13. Test-Driven Development. PART 3 System Analysis 14. Reliability. 15. Availability. 16. Maintainability. 17. Performance Evaluation. 18. Optimizing Complex Systems Operation. PART 4 System Testing 19. Types of Testing. 20. Software Text. 21. Error Handling. 22. Automated Test Systems Design. 23. Interoperability. PART 5 System Health 24.Uncertainty and Uncertainty Propagation. 25. Fault Detection, Localization, and Isolation. 26. Risk and Risk Analysis. 27. Risk-Based Prognostics and Health Management. 28. Structural Health Monitoring. PART 6 System Security 29. Risk Management Framework. 30. Information Assurance, Vulnerability Analysis, and Remediation. 31. Cryptographic Systems. 32. Software Security. PART 7 System Usage 33. Human Systems Interaction - Interface Design. 34. Human and Privacy Rights. 35. Humanitarian Well-Being. 36. The Social Impacts of Complex Systems.