Quantitative X-Ray Spectrometry

Inbunden, Engelska, 1995

4 929 kr

Beställningsvara. Skickas inom 10-15 vardagar. Fri frakt för medlemmar vid köp för minst 249 kr.

This work covers important aspects of X-ray spectrometry, from basic principles to the selection of instrument parameters and sample preparation. This edition explicates the use of combined X-ray fluorescence and X-ray diffraction data, and features new applications in environmental studies, forensic science, archeometry and the analysis of metals and alloys, minerals and ore, ceramic materials, catalysts and trace metals.;This work is intended for spectroscopists, analytical chemists, materials scientists, experimental physicists, mineralogists, biologists, geologists and graduate-level students in these disciplines.

Produktinformation

Utgivningsdatum1995-04-26
Mått156 x 234 x 31 mm
Vikt839 g
FormatInbunden
SpråkEngelska
SeriePractical Spectroscopy
Antal sidor504
Upplaga2
FörlagTaylor & Francis Inc
ISBN9780824795542

Tillhör följande kategorier

Analytisk kemi inom Naturvetenskap och teknik

The interaction of X-rays with matter; sources for the excitation of characteristic X-rays; instrumentation; statistics; general computer applications and quantitative spectrum analysis as applied to energy-dispersive analysis; specimen preparation; qualitative analysis; basic problems in quantitative analysis; methods and models for quantitative analysis; trace analysis; radiation health hazards in X-ray spectrometry; applications of X-ray spectrometry. Appendices: no-menclature; mass absorption coefficients; conversions and physical constants; atomic weights and densities; wavelengths and energies; wavelength tables for K, L, and M series.

"International praise for the previous edition. . . . . .critically describes x-ray instrumentation and techniques. . .has one of the most extensive discussions of energy-dispersive x-ray spectrometry of any book. "---Analytical Chemistry". . .a valuable compendium for the practicing x-ray spectroscopist in industry and science or researchers in other fields who have to apply x-ray analysis. "---Journal of Applied Crystallography"Ron Jenkins could. . .be described as the doyen of XRF and together with his colleagues R. W. Gould and Dale Gedcke brings vast wealth of experience to the subject of XRF. . .. . . .the main revisions to this second edition are the inclusion of details of layered synthetic microstructures, total reflection X-ray spectrometry, and the influence of the personal computer. . ..an important contribution to XRF and will be of interest to both new and established workers in this field. "---Journal of Analytical Atomic Spectrometry

Mer från samma författare

Advances in X-Ray Analysis

Charles S. Barrett, jerome B. Cohen, John Faber, Jr., Ron Jenkins, Donald E. Leyden, John C. Russ, Paul K. Predecki

Inbunden

2 729 kr

Advances in X-Ray Analysis

Charles S. Barrett, Conference on Applications of X-Ray Anal, Charles S. Barrett, J.V. Gilfrich, Ron Jenkins, John C. Russ, J.W. Richardson Jr., Paul K. Predecki

Inbunden

2 729 kr

Proceedings of Combined First Pacific-International Conference on X-Ray Analytical Methods and Fortieth Annual Conference on Applications of X-Ray Analysis Held in Hilo and Honolulu, Hawaii, August 7-16, 1991

Charles S. Barrett, John V. Gilfrich, Ting C. Huang, Ron Jenkins, G. J. McCarthy, Paul K. Predecki, R. Ryon, Deane K. Smith

Inbunden

1 109 kr

Advances in x-Ray Analysis

John V. Gilfrich, C.C. Goldsmith, Ting C. Huang, Ron Jenkins, I. Cev Noyan

Inbunden

1 109 kr

Advances in X-Ray Analysis

D.K. Bowen, John V. Gilfrich, C.C. Goldsmith, Ting C. Huang, Ron Jenkins, I. Cev Noyan, Paul K. Predecki, Deane K. Smith

Inbunden

4 089 kr

Advances in X-Ray Analysis

I. C. Noyan, T. C. Huang, John V. Gilfrich, I. Cev Noyan, Ron Jenkins, Ting C. Huang, Robert L. Snyder, Deane K. Smith, Mary Ann Zaitz, Paul K. Predecki

Inbunden

4 089 kr