Franck Bayle is an electronic engineer by training. He has practiced for almost 15 years, working at Crouzet and then at Thalès in Valence, France. He has also worked in reliability and maturity.

• Foreword by Laurent Denis ixForeword by Serge Zaninotti xiiiAcknowledgements xvIntroduction xviiChapter 1 Sampling in Manufacturing 11.1 Cost aspects 21.2 Considering the distribution of defects 71.3 Considering the test coverage 10Chapter 2 Compliance Test 13Chapter 3 Non-Regression Tests 173.1 Non-regression on a physical quantity 173.2 Non-regression depending on time 20Chapter 4 Zero-Failure Reliability Demonstration 234.1 Purpose of zero-failure tests 234.2 Theoretical principle 234.2.1 Non-maintained products 244.2.2 Maintained products 294.2.3 Estimation of parameter β 324.2.4 Physical laws of failure 354.3 Optimization of test costs 424.4 Specific cases 484.4.1 Imposed number of parts 484.4.2 Imposed testing time 484.4.3 Imposed testing time and number of parts 494.4.4 A test was already conducted and the demonstrated reliability should be estimated 504.4.5 One test was already conducted and failure to demonstrate reliability must be known 514.4.6 Two tests were conducted 514.4.7 A second test is conducted 604.4.8 Reliability objective is a failure rate 694.4.9 Reliability data are available from the manufacturer 714.4.10 Demonstration of reliability at the product level 744.4.11 Taking into account a complex life profile 76Chapter 5 Reliability Management 795.1 Context 795.2 Physical architecture division 805.3 Classification of subsets 815.4 Allocation of initial reliability 815.5 Estimation of the reliability of subsets 825.5.1 Consistency with the experience feedback 855.5.2 Estimation of the power of the test 855.5.3 Simulation algorithm 855.6 Optimal allocation of the reliability of subsets 905.7 Illustration 905.8 Definition of design rules 1035.9 Construction of a global predicted reliability model with several manufacturers 107Chapter 6 Confirmation of Maturity 1156.1 Internal data from equipment manufacturer 1156.2 System manufacturer data 1176.2.1 Original fit removal rate or “zero hour returns” 1176.3 End-customer data 1216.3.1 Burn-in effectiveness 1216.3.2 First failure analysis 1216.3.3 Method based on failure analysis 1246.3.4 Observed reliability 1246.3.5 Estimation of the forecasting number of catastrophic failures 1286.4 Burn-in optimization 1346.4.1 Distribution of failures observed during HASS cycles 1346.4.2 Verification of the degradation of the manufacturing process 136List of Notations 139List of Definitions 141List of Acronyms 147References 151Index 155

Franck Bayle is an electronic engineer by training. He has practiced for almost 15 years, working at Crouzet and then at Thalès in Valence, France. He has also worked in reliability and maturity.

• Foreword by Laurent Denis ixForeword by Serge Zaninotti xiiiAcknowledgements xvIntroduction xviiChapter 1 Sampling in Manufacturing 11.1 Cost aspects 21.2 Considering the distribution of defects 71.3 Considering the test coverage 10Chapter 2 Compliance Test 13Chapter 3 Non-Regression Tests 173.1 Non-regression on a physical quantity 173.2 Non-regression depending on time 20Chapter 4 Zero-Failure Reliability Demonstration 234.1 Purpose of zero-failure tests 234.2 Theoretical principle 234.2.1 Non-maintained products 244.2.2 Maintained products 294.2.3 Estimation of parameter β 324.2.4 Physical laws of failure 354.3 Optimization of test costs 424.4 Specific cases 484.4.1 Imposed number of parts 484.4.2 Imposed testing time 484.4.3 Imposed testing time and number of parts 494.4.4 A test was already conducted and the demonstrated reliability should be estimated 504.4.5 One test was already conducted and failure to demonstrate reliability must be known 514.4.6 Two tests were conducted 514.4.7 A second test is conducted 604.4.8 Reliability objective is a failure rate 694.4.9 Reliability data are available from the manufacturer 714.4.10 Demonstration of reliability at the product level 744.4.11 Taking into account a complex life profile 76Chapter 5 Reliability Management 795.1 Context 795.2 Physical architecture division 805.3 Classification of subsets 815.4 Allocation of initial reliability 815.5 Estimation of the reliability of subsets 825.5.1 Consistency with the experience feedback 855.5.2 Estimation of the power of the test 855.5.3 Simulation algorithm 855.6 Optimal allocation of the reliability of subsets 905.7 Illustration 905.8 Definition of design rules 1035.9 Construction of a global predicted reliability model with several manufacturers 107Chapter 6 Confirmation of Maturity 1156.1 Internal data from equipment manufacturer 1156.2 System manufacturer data 1176.2.1 Original fit removal rate or “zero hour returns” 1176.3 End-customer data 1216.3.1 Burn-in effectiveness 1216.3.2 First failure analysis 1216.3.3 Method based on failure analysis 1246.3.4 Observed reliability 1246.3.5 Estimation of the forecasting number of catastrophic failures 1286.4 Burn-in optimization 1346.4.1 Distribution of failures observed during HASS cycles 1346.4.2 Verification of the degradation of the manufacturing process 136List of Notations 139List of Definitions 141List of Acronyms 147References 151Index 155

Franck Bayle is an electronic engineer by training. He has practiced for almost 15 years, working at Crouzet and then at Thalès in Valence, France. He has also worked in reliability and maturity.

• Foreword by Laurent Denis ixForeword by Serge Zaninotti xiiiAcknowledgements xvIntroduction xviiChapter 1 Sampling in Manufacturing 11.1 Cost aspects 21.2 Considering the distribution of defects 71.3 Considering the test coverage 10Chapter 2 Compliance Test 13Chapter 3 Non-Regression Tests 173.1 Non-regression on a physical quantity 173.2 Non-regression depending on time 20Chapter 4 Zero-Failure Reliability Demonstration 234.1 Purpose of zero-failure tests 234.2 Theoretical principle 234.2.1 Non-maintained products 244.2.2 Maintained products 294.2.3 Estimation of parameter β 324.2.4 Physical laws of failure 354.3 Optimization of test costs 424.4 Specific cases 484.4.1 Imposed number of parts 484.4.2 Imposed testing time 484.4.3 Imposed testing time and number of parts 494.4.4 A test was already conducted and the demonstrated reliability should be estimated 504.4.5 One test was already conducted and failure to demonstrate reliability must be known 514.4.6 Two tests were conducted 514.4.7 A second test is conducted 604.4.8 Reliability objective is a failure rate 694.4.9 Reliability data are available from the manufacturer 714.4.10 Demonstration of reliability at the product level 744.4.11 Taking into account a complex life profile 76Chapter 5 Reliability Management 795.1 Context 795.2 Physical architecture division 805.3 Classification of subsets 815.4 Allocation of initial reliability 815.5 Estimation of the reliability of subsets 825.5.1 Consistency with the experience feedback 855.5.2 Estimation of the power of the test 855.5.3 Simulation algorithm 855.6 Optimal allocation of the reliability of subsets 905.7 Illustration 905.8 Definition of design rules 1035.9 Construction of a global predicted reliability model with several manufacturers 107Chapter 6 Confirmation of Maturity 1156.1 Internal data from equipment manufacturer 1156.2 System manufacturer data 1176.2.1 Original fit removal rate or “zero hour returns” 1176.3 End-customer data 1216.3.1 Burn-in effectiveness 1216.3.2 First failure analysis 1216.3.3 Method based on failure analysis 1246.3.4 Observed reliability 1246.3.5 Estimation of the forecasting number of catastrophic failures 1286.4 Burn-in optimization 1346.4.1 Distribution of failures observed during HASS cycles 1346.4.2 Verification of the degradation of the manufacturing process 136List of Notations 139List of Definitions 141List of Acronyms 147References 151Index 155