Process Improvement in the Electronics Industry

YEFIM FASSER, PhD, is Director of Systems and Statistical Engineering at Advanced Micro Devices, Inc. DONALD BRETTNER is Group Vice President at Advanced Micro Devices, Inc.

• Preface. Acknowledgment. PART I: THE HUMAN SIDE OF PROCESS IMPROVEMENT. The Concepts of Process Improvement. Improving the Management Process. Systems and Systems Thinking. Creativity and Innovation. Some Basic Concepts of Variation. PART II: PROCESS CONTROL AND CAPABILITY STUDIES. Some Important Probability Distributions. Statistical Process Control. Measurement and Inspection Capability Studies. Process Capability Study. Working with Skewed Distributions. Engineering Specifications. Zero Defects Process Capability. Managing Sampling Systems in a Low ppm Environment. PART III: OFF-LINE AND ON-LINE DESIGN OF EXPERIMENTS. Off-Line Design of Experiments. On-Line Design of Experiments. APPENDICES. Appendix A: The Effect of Tampering with the Process. Appendix B: Factors for Constructing Control Charts. Appendix C: Area Under Normal Distribution (Z Table). Appendix D: Tables for Testing Skewness and Kurtosis. Appendix E: Percentage Points of the F Distribution. Appendix F: Orthogonal Arrays. Appendix G: Omega Transformation Table. Appendix H: Percentage Points of the t Distribution. Appendix I: Percentage Points of the x? Distribution. Appendix J: Cumulative Poisson Distribution. Appendix K: Supporting Theory for the CCC Chart and the Process Rejection Sampling Plan. Appendix L: Value of e?-x. Appendix M: One-Sided and Two-Sided Statistical Tolerance Intervals. Appendix N: A Quick Method to Design the OC and AOQ Curves for c = 0 Sampling Plans. Appendix O: np Values for Various Confidence Intervals, Probabilities of Acceptance, and Numbers of Nonconforming Units. Glossary. Index.

"...well written and covers, in a useful fashion, an extremely wide range of relevant subjects." (Technometrics, Vol. 45, No. 4, November 2003)