Principles of Electron Optics, Volume 1

Basic Geometrical Optics

Häftad, Engelska, 2017

Av Peter W. Hawkes, Erwin Kasper, Peter W Hawkes

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Volume one of Principles of Electron Optics: Basic Geometrical Optics, Second Edition, explores the geometrical optics needed to analyze an extremely wide range of instruments: cathode-ray tubes; the family of electron microscopes, including the fixed-beam and scanning transmission instruments, the scanning electron microscope and the emission microscope; electron spectrometers and mass spectrograph; image converters; electron interferometers and diffraction devices; electron welding machines; and electron-beam lithography devices.

The book provides a self-contained, detailed, modern account of electron optics for anyone involved with particle beams of modest current density in the energy range up to a few mega-electronvolts. You will find all the basic equations with their derivations, recent ideas concerning aberration studies, extensive discussion of the numerical methods needed to calculate the properties of specific systems and guidance to the literature of all the topics covered. A continuation of these topics can be found in volume two, Principles of Electron Optics:�Applied Geometrical Optics.

The book is intended for postgraduate students and teachers in physics and electron optics, as well as researchers and scientists in academia and industry working in the field of electron optics, electron and ion microscopy and nanolithography.

Offers a fully revised and expanded new edition based on the latest research developments in electron optics
Written by the top experts in the field
Covers every significant advance in electron optics since the subject originated
Contains exceptionally complete and carefully selected references and notes
Serves both as a reference and text

Produktinformation

Utgivningsdatum2017-10-29
Mått191 x 235 x 42 mm
Vikt1 500 g
FormatHäftad
SpråkEngelska
Antal sidor728
Upplaga2
FörlagElsevier Science
ISBN9780081022566

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Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics. Erwin Kasper studied physics at the Universities of Münster and Tübingen (Germany), where he obtained his PhD in 1965 and the habilitation to teach physics in 1969. After scientific spells in the University of Tucson, Arizona (1966) and in Munich (1970), he resumed his research and teaching in the Institute of Applied Physics, University of Tübingen, where he was later appointed professor. He lectured on general physics and especially on electron optics. The subject of his research was theoretical electron optics and related numerical methods on which he published numerous papers. After his retirement in 1997, he published a book on numerical field calculation (2001).

1. IntroductionPART I – CLASSICAL MECHANICS2. Relativistic Kinematics3. Different Forms of Trajectory Equations4. Variational Principles5. Hamiltonian OpticsPART II – CALCULATION OF STATIC FIELDS6. Basic Concepts and Equations7. Series Expansions8. Boundary-Value Problems9. Integral Equations10. The Boundary-Element Method11. The Finite-Difference Method (FDM)12. The Finite-Element Method (FEM)13. Field-Interpolation TechniquesPART III – THE PARAXIAL APPROXIMATION14. Introduction15. Systems with an Axis of Rotational Symmetry16. Gaussian Optics of Rotationally Symmetric Systems: Asymptotic Image Formation17. Gaussian Optics of Rotationally Symmetric Systems: Real Cardinal Elements18. Electron Mirrors19. Quadrupole Lenses20. Cylindrical LensesPART IV – ABERRATIONS21. Introduction22. Perturbation Theory: General Formalism23. The Relation Between Permitted Types of Aberration and System Symmetry24. The Geometrical Aberrations of Round Lenses25. Asymptotic Aberration Coefficients26. Chromatic Aberrations27. Aberration Matrices and the Aberrations of Lens Combinations28. The Aberrations of Mirrors and Cathode Lenses29. The Aberrations of Quadrupole Lenses and Octopoles30. The Aberrations of Cylindrical Lenses31. Parasitic AberrationsPART V – DEFLECTION SYSTEMS32. Paraxial Properties of Deflection Systems33. The Aberrations of Deflection SystemsPART VI – COMPUTER-AIDED ELECTRON OPTICS34. Numerical Calculation of Trajectories, Paraxial Properties and Aberrations