Precision Landmark Location for Machine Vision and Photogrammetry

Finding and Achieving the Maximum Possible Accuracy

Inbunden, Engelska, 2007

AvJosé A. Gutierrez,Brian S.R. Armstrong,Jose A. Gutierrez,José a. Gutierrez,Brian S. R. Armstrong

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The least possible photogrammetric uncertainty in a given situation is determined using the Cramér–Rao Lower Bound (CRLB).This monograph provides the reader with: the most complete treatment to date of precision landmark location and the engineering aspects of image capture and processing;

Produktinformation

Utgivningsdatum2007-10-23
Mått155 x 235 x 15 mm
Vikt436 g
FormatInbunden
SpråkEngelska
Antal sidor162
Upplaga2008
FörlagSpringer London Ltd
ISBN9781846289125

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José A. Gutiérrez is Principal Engineer at the Innovation Center of Eaton Corporation, leading the technical activities in Wireless Sensor Networks. He received the B.S. degree in electronic engineering from Universidad Simon Bolivar in Caracas, Venezuela, in 1991, and the M.S. in electrical engineering from the University of Wisconsin - Milwaukee in 2001. Currently he is a Ph.D. candidate at the same institution. Mr. Gutiérrez is an active member of the IEEE LAN/MAN Standards Committee and Editor in-Chief of the IEEE 802.15 Working Group, Task Group 4, focused in the development of Low-Rate Wireless Personal Area Networks. His areas of expertise include control systems, wireless communication, networking, information theory, bioelectronics, and standards development. He has two patents filed and is author of several papers in the areas of automatic control, artificial intelligence, and wireless communications.