Optics at the Nanometer Scale

Imaging and Storing with Photonic Near Fields

Inbunden, Engelska, 1996

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This volume deals with the fundamentals of and the recent developments and applications of near-field optical microscopy, giving basic accounts of how and under what circumstances superresolution beyond the half-wavelength Rayleigh limit is achieved. Interferometric and fluorescence techniques are also described, leading to molecular and even atomic resolution using light. The storage of optical information at this level of resolution is also addressed.

Produktinformation

Utgivningsdatum1996-04-30
Mått160 x 240 x 22 mm
Vikt641 g
FormatInbunden
SpråkEngelska
SerieNATO Science Series E:
Antal sidor312
Upplaga1996
FörlagKluwer Academic Publishers
ISBN9780792340201

Tillhör följande kategorier

Theory and Basic Principles.- Theory of Imaging in Near-Field Microscopy.- Light Scattering by Tips in Front of Surfaces.- A Numerical Study of a Model Near-Field Optical Microscope.- Short and Long Range Interactions in Near Field Optics.- Modelling Optical Resonators Probed by Subwavelength Sized Optical Detectors.- Experiments: Fundamentals and Applications.- Instrumentation in Near Field Optics.- Effect of the Coherence in Near Field Microscopy.- Scanning Interferometric Apertureless Microscopy at Ten Angstrom Resolution.- Primary Imaging Modes in Near-Field Microscopy.- Local Excitation of Surface Plasmons by TNOM.- Weak Localization of Surface Plasmon Polaritons: Direct Observation with Photon Scanning Tunneling Microscope.- STM-Induced Photon Emission from Au (110).- Writing of Nanolines on a Ferroelectric Surface with a Scanning Near-Field Optical Microscope.- Near Field Optics with High-Q Whispering-Gallery Modes.- Fluorescence Microscopy and Spectroscopy by Scanning Near-Field Optical/Atomic Force Microscope (SNOM-AFM).- Fluorescence Lifetime Contrast Combined with Probe Microscopy.- Towards SNIM: Scanning Near-Field Microscopy in the Infrared.- 6 NM Lateral Resolution in Scanning Near Field Optical Microscopy with the Tetrahedral Tip.- An Aperture-Type Reflection-Mode SNOM.- Surface Modifications Via Photo-Chemistry in a Reflection Scanning Near-Field Optical Microscope.- Near-Field Diffraction Microscopy with a Coherent Low-Energy e-Beam: Fresnel Projection Microscope.- Author Index.