Del i serien Institute of Physics Conference Series

Microbeam Analysis

Proceedings of the International Conference on Microbeam Analysis, 8-15 July, 2000

Inbunden, Engelska, 2000

13 309 kr

Beställningsvara. Skickas inom 3-6 vardagar. Fri frakt för medlemmar vid köp för minst 249 kr.

Microbeam Analysis provides a major forum for the discussion of the latest microanalysis techniques using electron, ion, and photon beams. The volume contains 250 papers from the leading researchers in this advancing field. Researchers in physics, materials science, and electrical and electronic engineering will find useful information in this volume.

Produktinformation

Utgivningsdatum2000-01-01
Mått156 x 234 x undefined mm
Vikt1 020 g
FormatInbunden
SpråkEngelska
SerieInstitute of Physics Conference Series
Antal sidor284
FörlagTaylor & Francis Ltd
ISBN9780750306850

Tillhör följande kategorier

Coverage includes: Overview of microanalytical techniques; Interactions of electron and photons with matter; Monte Carlo simulation: a tool to understand practical problems; Analytical electron microscopy; Recent developments in Auger electron spectroscopy and microscopy; Quantification procedures in EPMA; Analysis of thin surface layers and multilayers by EPMA; Standardless quantitative analysis; Image processing and microscopy; Quantification of X-ray spectra; Analysis of ultra-light elements by EPMA; Sample preparation; Applications of energy dispersive spectrometry in materails science; Difficulties in microprobe analysis; Applications of electron energy loss spectroscopy; X-ray emission valence band spectrometry; Radiation damage and charging effects in SEM, EPMA and related techniques; Electron spectroscopy: principles and applications; Future applications.

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Del i serien Institute of Physics Conference Series

Microbeam Analysis

Proceedings of the International Conference on Microbeam Analysis, 8-15 July, 2000

Inbunden, Engelska, 2000

AvD Williams,R Shimizu

13 309 kr

Beställningsvara. Skickas inom 3-6 vardagar. Fri frakt för medlemmar vid köp för minst 249 kr.

Produktinformation

Utgivningsdatum2000-01-01
Mått156 x 234 x undefined mm
Vikt1 020 g
FormatInbunden
SpråkEngelska
SerieInstitute of Physics Conference Series
Antal sidor284
FörlagTaylor & Francis Ltd
ISBN9780750306850

Tillhör följande kategorier

Coverage includes: Overview of microanalytical techniques; Interactions of electron and photons with matter; Monte Carlo simulation: a tool to understand practical problems; Analytical electron microscopy; Recent developments in Auger electron spectroscopy and microscopy; Quantification procedures in EPMA; Analysis of thin surface layers and multilayers by EPMA; Standardless quantitative analysis; Image processing and microscopy; Quantification of X-ray spectra; Analysis of ultra-light elements by EPMA; Sample preparation; Applications of energy dispersive spectrometry in materails science; Difficulties in microprobe analysis; Applications of electron energy loss spectroscopy; X-ray emission valence band spectrometry; Radiation damage and charging effects in SEM, EPMA and related techniques; Electron spectroscopy: principles and applications; Future applications.