Brunero Cappella, born 1970 in Italy, studied physics in the University of Pisa. In 1999 he moved to Berlin, where he worked in the Federal Institute for Materials Testing and Research. He received his PhD in materials science in 2002 from the Technical University of Berlin and his habilitation in Physical Chemistry in 2008 at the University of Siegen. Currently, he is working in the Federal Institute for Materials Testing and Research, leading the group "Contact mechanics", and he is a lecturer for Physical Chemistry at the University of Siegen. Since the very beginning of his scientific career, Brunero Cappella has been studying surface physics, atomic force microscopy and in particular AFM force-distance curves. He has written several papers; two recent review articles about force-distance curves for Surface Science Reports are among the most cited works of the journal (664 citations for the first and 1189 citations for the second article).

• Part I Principles: Theory and Practice: Physical principles of Force-Distance Curves by Atomic Force Microscopy.- Force-Distance Curves in Practice.- Part II Case Studies: Mechanical Properties of Homogeneous Polymer Films, Thin Polymer Films and Polymer Blends: Homogeneous Polymer Films.- Thin Polymer Films.- Polymer Blends.- Creep Compliance Measurement and Force-Modulation.

Brunero Cappella, born 1970 in Italy, studied physics in the University of Pisa. In 1999 he moved to Berlin, where he worked in the Federal Institute for Materials Testing and Research. He received his PhD in materials science in 2002 from the Technical University of Berlin and his habilitation in Physical Chemistry in 2008 at the University of Siegen. Currently, he is working in the Federal Institute for Materials Testing and Research, leading the group "Contact mechanics", and he is a lecturer for Physical Chemistry at the University of Siegen. Since the very beginning of his scientific career, Brunero Cappella has been studying surface physics, atomic force microscopy and in particular AFM force-distance curves. He has written several papers; two recent review articles about force-distance curves for Surface Science Reports are among the most cited works of the journal (664 citations for the first and 1189 citations for the second article).

• Part I Principles: Theory and Practice: Physical principles of Force-Distance Curves by Atomic Force Microscopy.- Force-Distance Curves in Practice.- Part II Case Studies: Mechanical Properties of Homogeneous Polymer Films, Thin Polymer Films and Polymer Blends: Homogeneous Polymer Films.- Thin Polymer Films.- Polymer Blends.- Creep Compliance Measurement and Force-Modulation.

Brunero Cappella, born 1970 in Italy, studied physics in the University of Pisa. In 1999 he moved to Berlin, where he worked in the Federal Institute for Materials Testing and Research. He received his PhD in materials science in 2002 from the Technical University of Berlin and his habilitation in Physical Chemistry in 2008 at the University of Siegen. Currently, he is working in the Federal Institute for Materials Testing and Research, leading the group "Contact mechanics", and he is a lecturer for Physical Chemistry at the University of Siegen. Since the very beginning of his scientific career, Brunero Cappella has been studying surface physics, atomic force microscopy and in particular AFM force-distance curves. He has written several papers; two recent review articles about force-distance curves for Surface Science Reports are among the most cited works of the journal (664 citations for the first and 1189 citations for the second article).

• Part I Principles: Theory and Practice: Physical principles of Force-Distance Curves by Atomic Force Microscopy.- Force-Distance Curves in Practice.- Part II Case Studies: Mechanical Properties of Homogeneous Polymer Films, Thin Polymer Films and Polymer Blends: Homogeneous Polymer Films.- Thin Polymer Films.- Polymer Blends.- Creep Compliance Measurement and Force-Modulation.