Carsten Steger studied computer science at the Technical University of Munich (TUM) and received his PhD degree from TUM in 1998. In 1996, he co-founded the company MVTec, where he heads the Research department. He has authored and co-authored more than 80 scientific publications in the field of computer and machine vision. In 2011, he was appointed a TUM honorary professor for the field of computer vision. Markus Ulrich studied Geodesy and Remote Sensing at the Technical University of Munich (TUM) and received his PhD degree from TUM in 2003. In 2003, he joined MVTec?s Research and Development department as a software engineer and became head of the research team in 2008. He has authored and co-authored scientific publications in the fields of photogrammetry and machine vision. Markus Ulrich is also a guest lecturer at TUM, where he teaches close-range photogrammetry. In 2017, he was appointed a Privatdozent (lecturer) at the Karlsruhe Institute of Technology (KIT) for the field of machine vision. Christian Wiedemann studied Geodesy and Remote Sensing at the Technical University of Munich (TUM) and received his PhD degree from TUM in 2001. He has authored and co-authored more than 40 scientific publications in the fields of photogrammetry, remote sensing, and machine vision. In 2003, he joined MVTec's Research and Development department as a software engineer. Since 2008, he has held different leading positions at MVTec.

• INTRODUCTION IMAGE ACQUISITIONIlluminationLensesCamerasCamera-Computer Interfaces MACHINE VISION ALGORITHMSFundamental Data StructuresImage EnhancementGeometric TransformationsImage SegmentationFeature ExtractionMorphologyEdge ExtractionSegmentation and Fitting of Geometric PrimitivesCamera CalibrationStereo ReconstructionTemplate MatchingOptical Character Recognition MACHINE VISION APPLICATIONSWafer DicingReading of Serial NumbersInspection of Saw BladesPrint InspectionInspection of Ball Grid ArraysSurface InspectionMeasuring of Spark PlugsMolding Flash DetectionInspection of Punched Sheets3D Plane Reconstruction with StereoPose Verification and ResistorsClassification of Non-Woven Fabrics