Rajpal S. Sirohi served as Professor of Physics at IIT Madras for more than two decades and as Director of IIT Delhi and Vice Chancellor to several Universities in India. He was a Distinguished Scholar at the Rose-Hulman Institute of Technology, Terre Haute, Indiana; Chair Professor at Tezpur University, Assam, India; and Faculty at Alabama A&M University, Huntsville, Alabama. Professor Rajpal S. Sirohi is now retired and spends his time reading books on the history of science and spends mornings and evenings with his grandchildren. His research areas are optical metrology, optical instrumentation, laser instrumentation, holography, and speckle phenomenon.

• Chapter 1 Introduction to Optics Chapter 2 Laser Beams Chapter 3 Sources, Detectors, and Recording Media Chapter 4 Interferometry Chapter 5 Holography and Digital Holography Chapter 6 Speckle Phenomenon, Speckle Photography, and Speckle Interferometry Chapter 7 The Moiré Phenomenon Chapter 8 Photoelasticity Chapter 9 Microscopy Chapter 10 Measurement of Refractive Index Chapter 11 Measurement of Radius of Curvature and Focal Length Chapter 12 Optical Testing Chapter 13 Angle Measurement Chapter 14 Thickness Measurement Chapter 15 Measurement of Velocity Chapter 16 Pressure Measurement Chapter 17 Temperature Measurement Chapter 18 Fiber-Optic and MEMs-Based Measurements Chapter 19 Length Measurement

Rajpal S. Sirohi served as Professor of Physics at IIT Madras for more than two decades and as Director of IIT Delhi and Vice Chancellor to several Universities in India. He was a Distinguished Scholar at the Rose-Hulman Institute of Technology, Terre Haute, Indiana; Chair Professor at Tezpur University, Assam, India; and Faculty at Alabama A&M University, Huntsville, Alabama. Professor Rajpal S. Sirohi is now retired and spends his time reading books on the history of science and spends mornings and evenings with his grandchildren. His research areas are optical metrology, optical instrumentation, laser instrumentation, holography, and speckle phenomenon.

• Chapter 1 Introduction to Optics Chapter 2 Laser Beams Chapter 3 Sources, Detectors, and Recording Media Chapter 4 Interferometry Chapter 5 Holography and Digital Holography Chapter 6 Speckle Phenomenon, Speckle Photography, and Speckle Interferometry Chapter 7 The Moiré Phenomenon Chapter 8 Photoelasticity Chapter 9 Microscopy Chapter 10 Measurement of Refractive Index Chapter 11 Measurement of Radius of Curvature and Focal Length Chapter 12 Optical Testing Chapter 13 Angle Measurement Chapter 14 Thickness Measurement Chapter 15 Measurement of Velocity Chapter 16 Pressure Measurement Chapter 17 Temperature Measurement Chapter 18 Fiber-Optic and MEMs-Based Measurements Chapter 19 Length Measurement

Rajpal S. Sirohi served as Professor of Physics at IIT Madras for more than two decades and as Director of IIT Delhi and Vice Chancellor to several Universities in India. He was a Distinguished Scholar at the Rose-Hulman Institute of Technology, Terre Haute, Indiana; Chair Professor at Tezpur University, Assam, India; and Faculty at Alabama A&M University, Huntsville, Alabama. Professor Rajpal S. Sirohi is now retired and spends his time reading books on the history of science and spends mornings and evenings with his grandchildren. His research areas are optical metrology, optical instrumentation, laser instrumentation, holography, and speckle phenomenon.

• Chapter 1 Introduction to Optics Chapter 2 Laser Beams Chapter 3 Sources, Detectors, and Recording Media Chapter 4 Interferometry Chapter 5 Holography and Digital Holography Chapter 6 Speckle Phenomenon, Speckle Photography, and Speckle Interferometry Chapter 7 The Moiré Phenomenon Chapter 8 Photoelasticity Chapter 9 Microscopy Chapter 10 Measurement of Refractive Index Chapter 11 Measurement of Radius of Curvature and Focal Length Chapter 12 Optical Testing Chapter 13 Angle Measurement Chapter 14 Thickness Measurement Chapter 15 Measurement of Velocity Chapter 16 Pressure Measurement Chapter 17 Temperature Measurement Chapter 18 Fiber-Optic and MEMs-Based Measurements Chapter 19 Length Measurement