Del 193 i serien Springer Series in Materials Science

In-situ Materials Characterization

Across Spatial and Temporal Scales

Inbunden, Engelska, 2014

AvAlexander Ziegler,Heinz Graafsma,Xiao Feng Zhang,Joost W.M. Frenken

1 379 kr

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The behavior of nanoscale materials can change rapidly with time either because the environment changes rapidly or because the influence of the environment propagates quickly across the intrinsically small dimensions of nanoscale materials.

Produktinformation

Utgivningsdatum2014-04-10
Mått155 x 235 x 19 mm
Vikt546 g
FormatInbunden
SpråkEngelska
SerieSpringer Series in Materials Science
Antal sidor256
Upplaga2014
FörlagSpringer-Verlag Berlin and Heidelberg GmbH & Co. KG
ISBN9783642451515

Tillhör följande kategorier

Scanning Probe Microscopy on 'Live' Catalysts.- In-situ X-ray diffraction at synchrotron and Free-Electron-Laser sources.- Advanced in situ transmission electron microscopy.- Ultra-fast TEM and Electron Diffraction.- In-Situ Materials Characterization with FIB/SEM.- In-situ X-ray photoelectron spectroscopy.- “Real-time” probing of photo-induced molecular processes in liquids by ultrafast X-ray absorption spectroscopy.- Time-Resolved Neutron Scattering.- Novel Detectors for Ultra-fast XRD, TEM and ED Characterization.