Del 1 i serien Zeitschrift für Kristallographie / Proceedings

European Powder Diffraction Conference; August 2010, Darmstadt, Germany

Name: European Powder Diffraction Conference; August 2010, Darmstadt, Germany
SKU: 9783486989403
Price: 8529 SEK
Availability: InStock
Author: Oldenbourg
ISBN: 9783486989403

Inbunden, Engelska, 2013

AvOldenbourg

8 529 kr

Beställningsvara. Skickas inom 11-20 vardagar. Fri frakt för medlemmar vid köp för minst 249 kr.

No detailed description available for "European Powder Diffraction Conference; August 2010, Darmstadt, Germany".

Produktinformation

Utgivningsdatum2013-11-15
Mått210 x 295 x 31 mm
Vikt1 421 g
FormatInbunden
SpråkEngelska
SerieZeitschrift für Kristallographie / Proceedings
Antal sidor560
Upplaga13001
FörlagDe Gruyter
ISBN9783486989403

Tillhör följande kategorier

Frontmatter -- PREFACE -- Editorial Notes -- European Powder Diffraction Conference Award for Young Scientists -- European Powder Diffraction Conference Award for Distinguished Powder Diffractionists -- Table of Contents -- I. METHOD DEVELOPMENT AND APPLICATION -- I.1 Determination of Crystal Structure -- Complementarities between precession electron and X-ray powder diffraction -- Differential Pair Distribution Function applied to Ce1-xGdxO2-x/2 system -- I.2 Qualitative and Quantitative Phase Analysis -- A suitable method for quantitative phase analysis of samples with high amorphous content -- UMo/Al nuclear fuel quantitative analysis via high energy X-ray diffraction -- I.3 Microstructure and Line Broadening Analysis -- Microstrain in nanocrystalline samples from atomistic simulation -- Simulating the temperature effect in a powder diffraction pattern with molecular dynamics -- A new combined approach to investigate stacking faults in lamellar compounds -- Factors affecting diffraction broadening analysis -- Crystallite size evolution in hydrothermal formation of kaolinite -- Particle statistics in synchrotron powder diffractometry -- High energy milling of Cu2O powders -- Defects in nanocrystalline ceria xerogel -- Determination of crystallite size distribution histogram in nanocrystalline anatase powders by XRD -- Crystal growth mechanism of kaolinites deduced from crystallite size distribution -- Diffraction peak broadening of energetic materials -- Calculation of a line profile for the diffractometer with a primary monochromator -- I.4 Texture -- Characterization of weakly deformed limestone from Chotec, Bohemia by neutron transmission -- Multiple scattering from textured polycrystals -- II. INSTRUMENTAL -- Powgen: A third-generation highresolution high-throughput powder diffraction instrument at the Spallation Neutron Source -- Technical concept of the materials science beamline at ALBA -- Instrumental calibration of laboratory X-ray powder diffractometers -- New anti-air-scatter screen for powder XRD with linear position sensitive detectors -- In-situ XRPD of hydrating cement with lab instrument: reflection vs. transmission measurements -- In-house characterization of protein powder -- Multiple reflections accompanying allowed and forbidden single reflections in bent Si-crystals -- 2?-scanning 2D-area detector for high quality powder data collection using synchrotron radiation -- III. SOFTWARE -- Adaption of a Rietveld code towards clay structure description -- Real-space powder diffraction computing on clusters of Graphics Processing Units -- Evaluation of algorithms and weighting methods for MEM analysis from powder diffraction data -- YAYLA, a program for handling area detector data of glasses -- IV. MATERIALS -- IV.1 Thin Layers -- HTXRD study of atomic layer deposited noble metal thin films heat treated in oxygen -- XRD real structure characterization of sputtered Au films different in thickness -- Liquid-phase self-terminated growth of MOF thin films: An X-ray diffraction study -- IV.2 Nanocrystalline and Amorphous Materials -- X-ray study of structure of the TiO2 nanotubes and nanowires -- Core-Shell structure of nanocrystalline AlN in real and reciprocal spaces -- Compression and thermal expansion of nanocrystalline TiN -- Diffraction analysis of grain growth in nanocrystalline Ni-W powders prepared by mechanical milling -- Orientational degeneracy of antiferromagnetic exchange striction in anisotropic ultrafine NiO nanocrystals -- IV.3 Metals and Alloys -- IV.3.1 General -- X-ray diffraction analysis of phases in weldments of super duplex stainless steels -- X-ray studies of martensitic transformation in Fe-Ni alloys rapidly quenched from the melt -- ?-?-?-martensitic transitions influence on the martensite decomposition of quenched steel -- IV.3.2 Microstructure, Stress and Texture -- Strain relaxation and grain growth in 316LVM stainless steel annealed under pressure -- Influence of elastic stress on stain

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Del 1 i serien Zeitschrift für Kristallographie / Proceedings

European Powder Diffraction Conference; August 2010, Darmstadt, Germany

Inbunden, Engelska, 2013

AvOldenbourg

8 529 kr

Beställningsvara. Skickas inom 11-20 vardagar. Fri frakt för medlemmar vid köp för minst 249 kr.

No detailed description available for "European Powder Diffraction Conference; August 2010, Darmstadt, Germany".

Produktinformation

Utgivningsdatum2013-11-15
Mått210 x 295 x 31 mm
Vikt1 421 g
FormatInbunden
SpråkEngelska
SerieZeitschrift für Kristallographie / Proceedings
Antal sidor560
Upplaga13001
FörlagDe Gruyter
ISBN9783486989403

Tillhör följande kategorier

Frontmatter -- PREFACE -- Editorial Notes -- European Powder Diffraction Conference Award for Young Scientists -- European Powder Diffraction Conference Award for Distinguished Powder Diffractionists -- Table of Contents -- I. METHOD DEVELOPMENT AND APPLICATION -- I.1 Determination of Crystal Structure -- Complementarities between precession electron and X-ray powder diffraction -- Differential Pair Distribution Function applied to Ce1-xGdxO2-x/2 system -- I.2 Qualitative and Quantitative Phase Analysis -- A suitable method for quantitative phase analysis of samples with high amorphous content -- UMo/Al nuclear fuel quantitative analysis via high energy X-ray diffraction -- I.3 Microstructure and Line Broadening Analysis -- Microstrain in nanocrystalline samples from atomistic simulation -- Simulating the temperature effect in a powder diffraction pattern with molecular dynamics -- A new combined approach to investigate stacking faults in lamellar compounds -- Factors affecting diffraction broadening analysis -- Crystallite size evolution in hydrothermal formation of kaolinite -- Particle statistics in synchrotron powder diffractometry -- High energy milling of Cu2O powders -- Defects in nanocrystalline ceria xerogel -- Determination of crystallite size distribution histogram in nanocrystalline anatase powders by XRD -- Crystal growth mechanism of kaolinites deduced from crystallite size distribution -- Diffraction peak broadening of energetic materials -- Calculation of a line profile for the diffractometer with a primary monochromator -- I.4 Texture -- Characterization of weakly deformed limestone from Chotec, Bohemia by neutron transmission -- Multiple scattering from textured polycrystals -- II. INSTRUMENTAL -- Powgen: A third-generation highresolution high-throughput powder diffraction instrument at the Spallation Neutron Source -- Technical concept of the materials science beamline at ALBA -- Instrumental calibration of laboratory X-ray powder diffractometers -- New anti-air-scatter screen for powder XRD with linear position sensitive detectors -- In-situ XRPD of hydrating cement with lab instrument: reflection vs. transmission measurements -- In-house characterization of protein powder -- Multiple reflections accompanying allowed and forbidden single reflections in bent Si-crystals -- 2?-scanning 2D-area detector for high quality powder data collection using synchrotron radiation -- III. SOFTWARE -- Adaption of a Rietveld code towards clay structure description -- Real-space powder diffraction computing on clusters of Graphics Processing Units -- Evaluation of algorithms and weighting methods for MEM analysis from powder diffraction data -- YAYLA, a program for handling area detector data of glasses -- IV. MATERIALS -- IV.1 Thin Layers -- HTXRD study of atomic layer deposited noble metal thin films heat treated in oxygen -- XRD real structure characterization of sputtered Au films different in thickness -- Liquid-phase self-terminated growth of MOF thin films: An X-ray diffraction study -- IV.2 Nanocrystalline and Amorphous Materials -- X-ray study of structure of the TiO2 nanotubes and nanowires -- Core-Shell structure of nanocrystalline AlN in real and reciprocal spaces -- Compression and thermal expansion of nanocrystalline TiN -- Diffraction analysis of grain growth in nanocrystalline Ni-W powders prepared by mechanical milling -- Orientational degeneracy of antiferromagnetic exchange striction in anisotropic ultrafine NiO nanocrystals -- IV.3 Metals and Alloys -- IV.3.1 General -- X-ray diffraction analysis of phases in weldments of super duplex stainless steels -- X-ray studies of martensitic transformation in Fe-Ni alloys rapidly quenched from the melt -- ?-?-?-martensitic transitions influence on the martensite decomposition of quenched steel -- IV.3.2 Microstructure, Stress and Texture -- Strain relaxation and grain growth in 316LVM stainless steel annealed under pressure -- Influence of elastic stress on stain