Del 378 i serien Wiley Series in Probability and Statistics

Elements of Applied Stochastic Processes

Inbunden, Engelska, 2002

2 849 kr

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This 3rd edition of the successful Elements of Applied Stochastic Processes improves on the last edition by condensing the material and organising it into a more teachable format. It provides more in-depth coverage of Markov chains and simple Markov process and gives added emphasis to statistical inference in stochastic processes. Integration of theory and application offers improved teachability Provides a comprehensive introduction to stationary processes and time series analysis Integrates a broad set of applications into the text Utilizes a wealth of examples from research papers and monographs

Produktinformation

Utgivningsdatum2002-09-24
Mått163 x 241 x 32 mm
Vikt894 g
FormatInbunden
SpråkEngelska
SerieWiley Series in Probability and Statistics
Antal sidor488
Upplaga3
FörlagJohn Wiley & Sons Inc
ISBN9780471414421

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Tillämpad matematik inom Naturvetenskap och teknik

Preface. Stochastic Processes: Description and Definition. Markov chains. Irreducible Markov Chains with Ergodic States. Branching Processes and Other Special Topics. Statistical Inference for Markov Chains. Applied Markov Chains. Simple Markov Processes. Statistical Inference for Simple Markov Processes. Applied Markov Processes. Renewal Processes. Stationary Processes and Time Series Analysis. Simulation and Markov Chain Monte Carlo. Answers to Selected Exercises. Appendix. Author Index. Subject Index.

"…provides excellent coverage of the basic topics…Bhat and Miller have provided an excellent text and reference book.” (Interfaces, July/ August 2004) "...an extended and well-written introduction to the theory...of stochastic processes and their applications..." (Zentralblatt Math, Vol. 1024, 2004)"...besides conveying the concepts of stochastic processes, this book succeeds in providing insight into the reasons why for a particular topic certain lines of investigation are pursued and why certain variables/functions are introduced." (Technometrics, Vol. 45, No. 3, August 2003)