Electron Microscopy In Materials Science - Proceedings Of The International School

• Electron optics and instrumentation, K.v.d. Mast; wave optical theory of imaging and electron holography, G. Pozzi; diffraction contrast - kinematical theory dynamical theory, defect simulation, S. Amelinckx; electron cristallography, J.W. Steeds; scanning transmission electron micsroscopy, S.J. Pennycook; electron energy loss spectroscopy, B. Jouffrey; x-ray analysis for TEM, A. Armigliato; the instrument - electron and backscattered electrons, O. Wells; x-ray analysis for SEM, C.E. Fiori; voltage contrast, M. Vanzi; cathodoluminescence techniques, G. Saparin; Monte Carlo methods, F. Salvat; electron beam induced current, H. Holt; scanning tunnelling microscopy, S. Selci; atomic force microscopy, L. Scandella.

"The standard here is very high indeed and there is, moreover, very little overlap with the Dundee school ... The editors must be congratulated on so very interesting a collection. An excellent way of understanding the new developments in our subject, not to be missed on any account." Ultramicroscopy, 1993