Häftad, Engelska, 2010
Del 2 i serien Lecture Notes in Electrical Engineering
Digital Noise Monitoring of Defect Origin
Av Telman Aliev
1409 kr
Beställningsvara. Skickas inom 10-15 vardagar. Fri frakt för medlemmar vid köp för minst 249 kr.
Beskrivning
Produktinformation
- Utgivningsdatum: 2010-11-24
- Mått: 155 x 235 x 13 mm
- Vikt: 365 g
- Format: Häftad
- Språk: Engelska
- Serie: Lecture Notes in Electrical Engineering
- Antal sidor: 224
- Förlag: Springer-Verlag New York Inc.
- ISBN: 9781441944108
Utforska kategorier
Recensioner i media
From the reviews: "The monograph builds on a long series of publications by the author over the last decade. ... monograph should benefit researchers and practicing engineers ... particularly those in search of new application tools in quality engineering applied in a broad setting. ... In summary this monograph is undoubtedly going to be a valuable research tool in the hands of an applied scientist, an engineer and a quality reliability engineer in industry." (Sailes K. Sengupta, Technometrics, Vol. 53 (1), February, 2011)
Butikslager
Ej i lager i butik.
Betyg & recensioner
0 recensioner
Inga recensioner tillgängliga.