Concise Encyclopedia of Materials Characterization

Robert S. Cahn received his B.S. from the University of Chicago in 1966 and his Ph.D. in Mathematics from Yale University in 1970. From 1970 until 1982, he was a member of the Department of Mathematics and Computer Science of the University of Miami and of the Mathematics Department of Lehman College from 1983-1985. In 1986 he joined the IBM Communications Department working on network design algorithms and network design tools. He has also designed a number of very large, high-speed networks for both IBM and IBM customers. He is the author or over 20 research articles spanning his various interests. He is adjunct professor of Computer Science at Polytechnic University and regularly teaches about network design.

• Editor's Preface – newly writtenAlphabetical List of ArticlesAn Introduction to Investigation and Characterization of MaterialsAcoustic Microscopy Adhesives: Tests for Mechanical Properties Amorphous Materials: Electron Spin Resonance Amorphous Materials: Nuclear Magnetic Resonance,Amorphous Materials: Nuclear Spin Relaxation Amorphous Materials: Small-Angle Scattering Amorphous Materials: Vibrational Spectroscopy Amorphous Materials: X-ray Absorption Spectroscopy Analytical Transmission Electron Microscopy Anodization Microscopy Art Forgeries: Scientific Detection Atomic Force Microscopy Auger Electron Microscopy Auger Microscopy: Angular Distribution Brittle Materials: Strength Testing Ceramics, Cathodoluminescence Analysis of Ceramics: Fracture Toughness Testing Ceramic Powders: Packing Characterization Channelling-Enhanced Microanalysis Chemical Analysis of Solid Surfaces Combinatorial Screening Composite Materials: Nondestructive Evaluation Compton Scattering Confocal Optical Microscopy Corrosion and Oxidation Study Techniques Corrosion: Test Methods Crack Growth Measurement Creep by Indentation Creep, Creep Rupture and Stress Relaxation TestingCreep-Fatigue Interaction Testing Dating Archaeological Materials Deep Level Transient Spectroscopy Depth Profiling Diffusion: Novel Measurement Methods *Diffusion Multiple Screening: Phase Diagram Mapping and Related Studies Dislocations: Experimental Observation Elastic Modulus Measurement Elastomers: Spectroscopic Characterization Elastomers: Tests for Mechanical Properties Electron Diffraction Electron Diffraction, Low-Energy Electron Energy Loss Spectrometry Electron Microscope Analysis of Defect Clusters, Voids and Bubbles Electron Microscopy, High-Voltage Electron Spectroscopy for Chemical Analysis Electron Spin Resonance Electron Tunnelling Spectroscopy Electronic Raman Spectroscopy Ellipsometry EMSAT, p. 2755Fatigue(Multiaxial) Testing Fatigue Testing Fatigue Testing: Thermal and Thermomechanical Field-Ion Microscopy Field-Ion Microscopy: Atom Probe Microanalysis Field-Ion Microscopy: Observation of Radiation Effects Fractal Analysis Fracture of Polymeric Materials Fracture Toughness Testing of Metallic MaterialsGamma Radiography Gamma-Ray Diffraction Gas and Liquid Chromatography Grain-Boundary Geometry: Measurement Grain-Size: Nondestructive Evaluation Hardness Testing High-Resolution Electron Micrsocopy High-Resolution Electron Microscopy of InterfacesHydrogen as a Metallurgical Probe Infrared Spectroscopy Impact Testing In-Reactor Creep Testing: Techniques Ion Backscattering Analysis Ion Chromatography Junction Transient Spectroscopy Kerr Microscopy Laser Microprobe Mass Spectrometry Laser Sampling Inductively Coupled Mass SpectrometryLiquid Chromatography Mass Spectrometry Luminescence Imaging of Ceramics Low-Energy Electron Diffraction Magnetic Force Microscopy Magnetic Materials: Measurements Magnetic Materials: Transmission Electron Microscopy Magnetic Measurements: Pulse Field Magnetic Measurements: Quasistatic and AC Magnetic Recording Measurements Magnetic Systems: De Haas van Alphen Studies of Fermi Surface Magnetism: Applications of Synchrotron RadiationMechanical Properties Microprobe Mechanical Testing at High Strain Rates Mechanical Testing Methods of Fibers and CompositesMechanical Testing of Ceramics Mechanical Testing: Overview Microengineering of Materials: Characterization Microstructural Evolution: Computer Simulation Microtextural Analysis Mössbauer Spectrometry Nanoindentation Techniques Nanometer-Scale Evaluation of Advanced Materials by Using Positrons Neutron Activation Analysis Neutron Diffraction Neutron Radiography Neutron Reflectometry for the Study of Absorption from Solution at Solid Surfaces, Nuclear Magnetic Resonance Spectroscopy Optical Calorimetry Optical Emission Spectroscopy Optical Microscopy Organic Mass Spectrometry Oxide Surfaces by STM, Study of Paper and Paperboard: Destructive Mechanical Testing Paper and Paperboard: Nondestructive Evaluation Paper Surfaces: Subjective Evaluation Particle-Induced X-Ray Emission Perturbed Angular Correlations (PAC) Phase Diagrams and Phase Stability: CalculationsPhotoelasticity Photoelectron Diffraction Pole Figures and Orientation Distribution FunctionsPolymer Dielectric Properties: Test Methods Polymers: Electron Micsocopy Polymers: Light Microscopy Polymers: Molecular Weight and its Distribution Polymers: Neutron Scattering Polymers: Raman Spectroscopy Polymers: Tests for Degradation and StabilisationPolymers: Tests for Flammability Polymers: Tests for Mechanical Properties Polymers: Tests for Thermal Properties Polymers: Thermal Analysis Polymers: X-Ray Scattering Porosity: Characterization and Investigation Positron Annihilation Spectroscopy of Defects in Metals Positron-Annihilation Techniques, Advanced, for Materials ResearchPowder Characterization Powder Mechanics Raman Spectroscopy and Microscopy Reflection Electron Microscopy Concise, p. 409Residual Stresses: Measurement by Diffraction Residual Stresses: Measurement by Raman Shift Residual Stresses: Measurement using Magnetoelastic Effects Residual Stresses: Measurement using Neutron Diffraction Scanning Electron Microscopy Scanning SQUID Microscope Scanning Tunneling Microscopy and Spectroscopy Secondary–Ion Mass Spectrometry Semiconductor Materials: Characterization by Etching Semiconducting Materials: Electron Microscopy Semiconductors, Electrical Evaluation of Semiconductors, Local Vibrational Mode Spectroscopy Semiconductors, Raman Spectroscopy of Semiconductors, Scanning Photoluminescence Semicrystalline Polymers: Lamellar Morphology by SAXS Single-Crystal X-Ray Diffraction Small-Specimen Mechanical Testing Solid-State Nuclear Track Detectors: ApplicationsSolid State: Study Using Muon Beams Spark-Source Mass Spectrography SQUIDS: Magnetic Microscopy EMSAT, p. 8787SQUIDS: The Instrument Stress Distribution: Analysis Using Thermoelastic Effect Superconducting Materials: Measurements Surface Chemistry: Electron Yield Spectroscopy Surface Chemistry: EXAFS Surface Evaluation by Atomic Force Microscopy Surface Photochemistry Thermal Transport Properties, Measurement of Texture: Nondestructive Characterization Thermal Analysis: An Overview Thermal Analysis: More Recent Developments Thermal Wave Imaging Thermally Contracting Materials: CharacterisationThermodynamic Activity: Measurement Thermoluminescence Thermophysical Measurements, Subsecond Thin Films: Characterization by X-Rays Thin Films: In-Situ Stress Measurement of Thin Films: Mechanical Testing Thin Films: Stress Measurement Techniques Transmission Electron Microscopy Vibrothermography Viscoelasticity/Anelasticity Wood: Acoustic Emission and Acousto-Ultrasonic Characteristics X-Ray Absorption Spectroscopy: EXAFS and XANES Techniques X-Ray and Neutron Diffraction Studies of Amorphous Solids X-Ray and Neutron Diffuse Scattering of Radiation-Induced Defects X-Ray Diffraction, Time-Resolved X-Ray Fluorescence Spectrometry X-Ray Microanalysis, Quantitative X-Ray Diffraction X-Ray Powder Diffraction X-Ray Topography