Atomic Force Microscopy

Prof. Dr. rer. nat. Bert Voigtländer studied Physics at the University of Cologne and the RWTH Aachen University, earning his Ph.D. in 1989. While a postdoctoral researcher at the IBM Research Center in Yorktown Heights, USA, he began his current field of research using scanning probe microscopy. As a staff scientist at the Jülich Research Centre (Forschungszentrum Jülich), his recent focus has been nanoscale charge transport measurements. In 2012, he founded the spin-off company mProbes, which offers multi-tip scanning probe microscopes. To date, he has authored and co-authored over 100 peer-reviewed publications.

• Introduction.- Part I: Scanning Probe Microscopy Instrumentation.- Harmonic Oscillator.- Technical Aspects of Scanning Probe Microscopy.- Scanning Probe Microscopy Designs.- Electronics for Scanning Probe Microscopy.- Lock-In Technique.- Data Representation and Image Processing.- Artifacts in SPM.- Work Function, Contact Potential, and Kelvin Probe.- Part II: Atomic Force Microscopy (AFM).- Forces between Tip and Sample.- Technical Aspects of Atomic Force Microscopy.- Static Atomic Force Microscopy.- Amplitude Modulation (AM) Mode in Dynamic Atomic Force Microscopy.- Intermittent Contact Mode/Tapping Mode.- Mapping of Mechanical Properties Using Force-Distance.- Frequency Modulation (FM) Mode in Dynamic Atomic Force.- Noise in Atomic Force Microscopy.- Quartz Sensors in Atomic Force Microscopy.

“Whether readers are just starting in the field or running an atomic force microscope daily, Voigtländer’s Atomic Force Microscopy will be an excellent companion. It will usefully complement the user manual or the application notes of any instrument. I wish it had been available when I was beginning my journey in nanoscience instrumentation 15 years ago, and I will certainly use it as a reference book for all the students coming through our laboratory’s door from now on.” (Ludovic Bellon, Physics Today, Vol. 73 (5), May, 2020)