Del 160 i serien Springer Series in Materials Science

Atom Probe Microscopy

Häftad, Engelska, 2014

AvBaptiste Gault,Michael P. Moody,Julie M. Cairney,Simon P. Ringer

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This book covers all facets of atom probe microscopy—including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography. Atom Probe Microscopy is aimed at researchers of all experience levels.

Produktinformation

Utgivningsdatum2014-06-11
Mått155 x 235 x 28 mm
Vikt646 g
FormatHäftad
SpråkEngelska
SerieSpringer Series in Materials Science
Antal sidor396
FörlagSpringer-Verlag New York Inc.
ISBN9781489989390

Tillhör följande kategorier

Preface.- Acknowledgements.- List of Acronyms and Abbreviations.- List of Terms.- List of Non-SI Units and Constant Values.- PART I Fundamentals.- 1. Introduction.- 2. Field Ion Microscopy.- 3 From Field Desorption Microscopy to Atom Probe Tomography.- Part II Practical aspects.- 4. Specimen Preparation.- 5. Experimental protocols in Field Ion Microscopy.- 6. Experimental protocols.- 7. Tomographic reconstruction.- PART III Applying atom probe techniques for materials science.- 8. Analysis techniques for atom probe tomography.- 9. Atom probe microscopy and materials science.- Appendices.

"Atom Probe Microscopy ... provides a much needed update on the topic and introduces the broader scientific community to this developing technique. ... this book fills a critical need for a revised and updated text that can educate and motivate new researchers and also provide up-to-date references for active practitioners. The balanced delivery of instructional and reference material, in tandem with excellent graphical examples, make this book a flexible text for any atom probe laboratory." (Daniel K. Schreiber, Analytical and Bioanalytical Chemistry, Vol.407, 2015)