Inbunden, Engelska, 1996
Del 52 i serien Monographs on the Physics and Chemistry of Materials
Atom Probe Field Ion Microscopy
Av M. K. Miller, A. Cerezo, M. G. Hetherington, G. D. W. Smith FRS
4509 kr
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Beskrivning
This book provides a definitive account of the theory, practice and applications of atom probe field ion microscopy (APFIM). The APFIM technique provides a unique method for observing and chemically identifying single atoms on solid surfaces. Recent advances in the method,which are largely due to the present authors, now permit the atomic-scale chemistry of a solid specimen to be recognised in three dimensions. As a result of these developments, new and exciting applications are rapidly emerging in the field of material science, surface science, and catalysis. The book is a state-of-the art account of this important field, and is intended for a graduate-level readership.
Produktinformation
- Utgivningsdatum: 1996-09-19
- Mått: 164 x 242 x 33 mm
- Vikt: 1 042 g
- Format: Inbunden
- Språk: Engelska
- Serie: Monographs on the Physics and Chemistry of Materials
- Antal sidor: 520
- Förlag: OUP OXFORD
- ISBN: 9780198513872
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Mer information
Hetherington - deceased
Recensioner i media
The book is an excellent resource for anyone entering the field ... strongly recommended at all levels among those who feel curious about this non-obvious way of doing high resolution ion microscopy and analysis at the atomic level.
Butikslager
Ej i lager i butik.
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