Inbunden, Engelska, 2021
Applications and Metrology at Nanometer-Scale 2
Measurement Systems, Quantum Engineering and RBDO Method
Av Pierre-Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami
2579 kr
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Beskrivning
Produktinformation
- Utgivningsdatum: 2021-05-07
- Mått: 10 x 10 x 10 mm
- Vikt: 454 g
- Format: Inbunden
- Språk: Engelska
- Antal sidor: 288
- Förlag: ISTE Ltd and John Wiley & Sons Inc
- ISBN: 9781786306876
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Mer information
Pierre Richard Dahoo is Professor and Holder of the Chair of Materials Simulation and Engineering at the University of Versailles Saint-Quentin in France. He is Director of Institut des Sciences et Techniques des Yvelines and a specialist in modeling and spectroscopy at the LATMOS laboratory of the CNRS. Philippe Pougnet is a former expert in reliability and the technologyproduct-process of embedded mechatronic systems. He graduated from Université Grenoble Alpes and Grenoble INP in France. Abdelkhalak El Hami is Professor at the Institut National des Sciences Appliquées (INSA-Rouen Normandie) in France and is in charge of the Normandy Conservatoire National des Arts et Metiers (CNAM) Chair of Mechanics, as well as several European pedagogical projects.
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