Advanced X-ray Detector Technologies

Krzysztof (Kris) Iniewski is managing R&D development activities at Redlen Technologies Inc., a detector company based in British Columbia, Canada. During his 15 years at Redlen he has managed development of highly integrated CZT detector products in medical imaging and security applications. Prior to Redlen Kris hold various management and academic positions at PMC-Sierra, University of Alberta, SFU, UBC and University of Toronto.  Dr. Iniewski has published over 150+ research papers in international journals and conferences. He holds 20+ international patents granted in USA, Canada, France, Germany, and Japan. He wrote and edited several books for Wiley, Cambridge University Press, Mc-Graw Hill, CRC Press and Springer. He is a frequent invited speaker and has consulted for multiple organizations internationally.

• Introduction to High-Z Semiconductor Detectors.- High-Z compound semiconductors as sensors for hybrid pixel area detectors.- Photon-integrating hybrid pixel array detectors for high-energy x-ray applications.- Photon counting detectors and their applications in medical imaging.- CZT Detectors for High-Flux.- Position-sensitive virtual Frisch-grid CdZnTe detectors and their applications.- Drift detectors and Compton cameras.- CdTe Pixel Detectors for Hard X-Ray Astronomy.- High-Z pixel sensor characterization for synchrotron applications.- High Performance CdTe/CZT Spectro-Imagers.