Inbunden, Engelska, 2008
Del 66 i serien Monographs on the Physics and Chemistry of Materials
Advanced Tomographic Methods in Materials Research and Engineering
Av John Banhart
4099 kr
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Beskrivning
Produktinformation
- Utgivningsdatum: 2008-03-20
- Mått: 162 x 240 x 25 mm
- Vikt: 955 g
- Format: Inbunden
- Språk: Engelska
- Serie: Monographs on the Physics and Chemistry of Materials
- Antal sidor: 490
- Förlag: OUP OXFORD
- ISBN: 9780199213245
Mer information
John Banhart - EditorProfessor for Materials Science at Technical University Berlin and Head of the Department of Materials Research at Hahn-Meitner Institute Berlin1984: Degree in Physics, University of Munich1989: PhD in Physical Chemistry, University of Munich1990: Postdoc at University of Vienna 1998: Habilitation (2nd PhD) in Solid State Physics, University of Bremen1991-2001: Senior Scientist at Fraunhofer-Institute for Materials Research Bremen2002: Current Position
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