Advances in Surface and Thin Film Diffraction: Volume 208

Charles S. Barrett, John V. Gilfrich, Ting C. Huang, Ron Jenkins, G. J. McCarthy, Paul K. Predecki, R. Ryon, Deane K. Smith, J. V. Gilfrich, C.S. Barrett, Charles S Barrett, Deane K Smith, J V Gilfrich, T C Huang, C S Barrett, John V Gilfrich, Ting C Huang, G J McCarthy, Paul K Predecki

I. C. Noyan, T. C. Huang, John V. Gilfrich, I. Cev Noyan, Ron Jenkins, Ting C. Huang, Robert L. Snyder, Deane K. Smith, Mary Ann Zaitz, Paul K. Predecki, John V Gilfrich, I Cev Noyan, Ting C Huang, Robert L Snyder, Deane K Smith, Paul K Predecki

Philip J. Cohen

Dan Brown

David J. Eaglesham, Carl V. Thompson, Steven M. Yalisove

Catarina König

Gilfrich, C. R. Hubbard, John V. Gilfrich, Ting C. Huang, C R Hubbard, J V Gilfrich, T C Huang, John V Gilfrich, Ting C Huang, M R James, Ron Jenkins, G R LaChance, Deane K Smith

John V. Gilfrich, USA) John V. Gilfrich (Sachs/Freeman Associates/NRL, Washington, DC, I. C. Noyan, Gilfrich, I C Noyan, C.C. Goldsmith, Ting C. Huang, Ron Jenkins, I. Cev Noyan, USA) Ting C. Huang (IBM Almaden Research Center, San Jose, CA, USA) Ron Jenkins (International Centre for Diffraction Data, Newton Square, Pennsylvania, USA) I. Cev Noyan (IBM Research Center, Yorktown Heights, NY, John V. Gilfrich, C.C. Goldsmith, T C Huang, Charles C Goldsmith, J V Gilfrich, John V Gilfrich, C C Goldsmith, Ting C Huang, Ron Jenkins, I Cev Noyan

D.K. Bowen, John V. Gilfrich, C.C. Goldsmith, Ting C. Huang, Ron Jenkins, I. Cev Noyan, Paul K. Predecki, Deane K. Smith, D. K. Bowen, D K Bowen, John V Gilfrich, C C Goldsmith, Ting C Huang, I Cev Noyan, Paul K Predecki, Deane K Smith