I. C. Noyan - Böcker
Advances in x-Ray Analysis
Av John V. Gilfrich, USA) John V. Gilfrich (Sachs/Freeman Associates/NRL, Washington, DC, I. C. Noyan, Gilfrich, I C Noyan, C.C. Goldsmith, Ting C. Huang, Ron Jenkins, I. Cev Noyan, USA) Ting C. Huang (IBM Almaden Research Center, San Jose, CA, USA) Ron Jenkins (International Centre for Diffraction Data, Newton Square, Pennsylvania, USA) I. Cev Noyan (IBM Research Center, Yorktown Heights, NY, John V. Gilfrich, C.C. Goldsmith, T C Huang, Charles C Goldsmith, J V Gilfrich, John V Gilfrich, C C Goldsmith, Ting C Huang, Ron Jenkins, I Cev Noyan
Inbunden, Engelska, 1994
1 139 kr
Advances in X-Ray Analysis
Av I. C. Noyan, T. C. Huang, John V. Gilfrich, I. Cev Noyan, Ron Jenkins, Ting C. Huang, Robert L. Snyder, Deane K. Smith, Mary Ann Zaitz, Paul K. Predecki, John V Gilfrich, I Cev Noyan, Ting C Huang, Robert L Snyder, Deane K Smith, Paul K Predecki
Inbunden, Engelska, 1998
4 189 kr