J. V. Gilfrich - Böcker
Advances in X-Ray Analysis
Av Charles S. Barrett, Conference on Applications of X-Ray Anal, Charles S. Barrett, J.V. Gilfrich, Ron Jenkins, John C. Russ, J.W. Richardson Jr., Paul K. Predecki, J. V. Gilfrich, Charles S., John V., Ting C. Huang
Inbunden, Engelska, 1989
2 799 kr
Proceedings of Combined First Pacific-International Conference on X-Ray Analytical Methods and Fortieth Annual Conference on Applications of X-Ray Analysis Held in Hilo and Honolulu, Hawaii, August 7-16, 1991
Av Charles S. Barrett, John V. Gilfrich, Ting C. Huang, Ron Jenkins, G. J. McCarthy, Paul K. Predecki, R. Ryon, Deane K. Smith, J. V. Gilfrich, C.S. Barrett, Charles S Barrett, Deane K Smith, J V Gilfrich, T C Huang, C S Barrett, John V Gilfrich, Ting C Huang, G J McCarthy, Paul K Predecki
Inbunden, Engelska, 1992
1 139 kr
Proceedings of the Forty-first Annual Conference Held in Colorado Springs, Colorado, August 3-7, 1992
Av Gilfrich, C. R. Hubbard, John V. Gilfrich, Ting C. Huang, C R Hubbard, J V Gilfrich, T C Huang, John V Gilfrich, Ting C Huang, M R James, Ron Jenkins, G R LaChance, Deane K Smith
Inbunden, Engelska, 1993
1 139 kr
Advances in x-Ray Analysis
Av John V. Gilfrich, USA) John V. Gilfrich (Sachs/Freeman Associates/NRL, Washington, DC, I. C. Noyan, Gilfrich, I C Noyan, C.C. Goldsmith, Ting C. Huang, Ron Jenkins, I. Cev Noyan, USA) Ting C. Huang (IBM Almaden Research Center, San Jose, CA, USA) Ron Jenkins (International Centre for Diffraction Data, Newton Square, Pennsylvania, USA) I. Cev Noyan (IBM Research Center, Yorktown Heights, NY, John V. Gilfrich, C.C. Goldsmith, T C Huang, Charles C Goldsmith, J V Gilfrich, John V Gilfrich, C C Goldsmith, Ting C Huang, Ron Jenkins, I Cev Noyan
Inbunden, Engelska, 1994
1 139 kr
Advances in X-Ray Analysis
Av Charles S. Barrett, J.V. Gilfrich, Ron Jenkins, John C. Russ, J.W. Richardson Jr., Paul K. Predecki, J. V. Gilfrich, J. W. Richardson Jr.
Häftad, Engelska, 2013
2 799 kr