USA) Ting C. Huang (IBM Almaden Research Center, San Jose, CA - Böcker
Visar alla böcker från författaren USA) Ting C. Huang (IBM Almaden Research Center, San Jose, CA.
1 produkt
1 produkt
Advances in x-Ray Analysis
Av John V. Gilfrich, USA) John V. Gilfrich (Sachs/Freeman Associates/NRL, Washington, DC, I. C. Noyan, Gilfrich, I C Noyan, C.C. Goldsmith, Ting C. Huang, Ron Jenkins, I. Cev Noyan, USA) Ting C. Huang (IBM Almaden Research Center, San Jose, CA, USA) Ron Jenkins (International Centre for Diffraction Data, Newton Square, Pennsylvania, USA) I. Cev Noyan (IBM Research Center, Yorktown Heights, NY, John V. Gilfrich, C.C. Goldsmith, T C Huang, Charles C Goldsmith, J V Gilfrich, John V Gilfrich, C C Goldsmith, Ting C Huang, Ron Jenkins, I Cev Noyan
Inbunden, Engelska, 1994
1 129 kr
Skickas inom 10-15 vardagar