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USA) I. Cev Noyan (IBM Research Center, Yorktown Heights, NY - Böcker

Visar alla böcker från författaren USA) I. Cev Noyan (IBM Research Center, Yorktown Heights, NY.
1 produkt

Advances in x-Ray Analysis

Proccedings of the Forty-Second Annual Conference on Applications of X-Ray Analysis Held in Denver, Colorado, August 2-6,

AvJohn V. Gilfrich,USA) John V. Gilfrich (Sachs/Freeman Associates/NRL, Washington, DC,I. C. Noyan,Gilfrich,I C Noyan,C.C. Goldsmith,Ting C. Huang,Ron Jenkins,I. Cev Noyan,USA) Ting C. Huang (IBM Almaden Research Center, San Jose, CA,USA) Ron Jenkins (International Centre for Diffraction Data, Newton Square, Pennsylvania,USA) I. Cev Noyan (IBM Research Center, Yorktown Heights, NY,John V. Gilfrich,C.C. Goldsmith,T C Huang,Charles C Goldsmith,J V Gilfrich,John V Gilfrich,C C Goldsmith,Ting C Huang,Ron Jenkins,I Cev Noyan

Inbunden, Engelska, 1994

1 109 kr

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