USA) I. Cev Noyan (IBM Research Center, Yorktown Heights, NY - Böcker

Visar alla böcker från författaren USA) I. Cev Noyan (IBM Research Center, Yorktown Heights, NY.

1 produkt

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Advances in x-Ray Analysis

Proccedings of the Forty-Second Annual Conference on Applications of X-Ray Analysis Held in Denver, Colorado, August 2-6,

Av John V. Gilfrich, USA) John V. Gilfrich (Sachs/Freeman Associates/NRL, Washington, DC m. fl

Inbunden, Engelska, 1994

1 109 kr

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