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Frontiers in Electronic Testing

78 produkter
Leendert M. Huisman - Data Mining and Diagnosing IC Fails, Inbunden
Del 31 - Frontiers in Electronic Testing

Data Mining and Diagnosing IC Fails

Av Leendert M. Huisman

Inbunden, Engelska, 2005

1 399 kr

Skickas inom 7-10 vardagar
Prithviraj Kabisatpathy, Alok Barua, Satyabroto Sinha - Fault Diagnosis of Analog Integrated Circuits, Inbunden
Del 30 - Frontiers in Electronic Testing

Fault Diagnosis of Analog Integrated Circuits

Av Prithviraj Kabisatpathy, Alok Barua, Satyabroto Sinha

Inbunden, Engelska, 2005

1 399 kr

Skickas inom 7-10 vardagar
Dimitris Gizopoulos - Advances in Electronic Testing, Inbunden
Del 27 - Frontiers in Electronic Testing

Advances in Electronic Testing

Av Dimitris Gizopoulos

Inbunden, Engelska, 2006

2 099 kr

Skickas inom 7-10 vardagar
Francisco da Silva, Teresa McLaurin, Tom Waayers, Francisco Da Silva - Core Test Wrapper Handbook, Inbunden
Del 35 - Frontiers in Electronic Testing

Core Test Wrapper Handbook

Av Francisco da Silva, Teresa McLaurin, Tom Waayers, Francisco Da Silva

Inbunden, Engelska, 2006

2 099 kr

Skickas inom 7-10 vardagar
Fernanda Lima Kastensmidt, Ricardo Reis, Luigi Carro - Fault-Tolerance Techniques for SRAM-Based FPGAs, Inbunden
Del 32 - Frontiers in Electronic Testing

Fault-Tolerance Techniques for SRAM-Based FPGAs

Av Fernanda Lima Kastensmidt, Ricardo Reis, Luigi Carro

Inbunden, Engelska, 2006

1 399 kr

Skickas inom 7-10 vardagar
Wolfgang Maichen - Digital Timing Measurements, Inbunden
Del 33 - Frontiers in Electronic Testing

Digital Timing Measurements

Av Wolfgang Maichen

Inbunden, Engelska, 2006

2 099 kr

Skickas inom 7-10 vardagar
Manoj Sachdev, José Pineda de Gyvez, Jose Pineda de Gyvez - Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits, Inbunden
Del 34 - Frontiers in Electronic Testing

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

Av Manoj Sachdev, José Pineda de Gyvez, Jose Pineda de Gyvez

Inbunden, Engelska, 2007

2 779 kr

Skickas inom 7-10 vardagar
Mohammad Tehranipoor - Emerging Nanotechnologies, Inbunden
Del 37 - Frontiers in Electronic Testing

Emerging Nanotechnologies

Av Mohammad Tehranipoor

Inbunden, Engelska, 2007

2 109 kr

Skickas inom 7-10 vardagar
José T. de Sousa, Peter Y.K. Cheung, Peter Y. K. Cheung - Boundary-Scan Interconnect Diagnosis, Inbunden
Del 18 - Frontiers in Electronic Testing

Boundary-Scan Interconnect Diagnosis

Av José T. de Sousa, Peter Y.K. Cheung, Peter Y. K. Cheung

Inbunden, Engelska, 2001

2 099 kr

Skickas inom 7-10 vardagar
M. Bushnell, Vishwani Agrawal - Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits, Inbunden
Del 17 - Frontiers in Electronic Testing

Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

Av M. Bushnell, Vishwani Agrawal

Inbunden, Engelska, 2000

1 819 kr

Skickas inom 7-10 vardagar
Michael Nicolaidis, Yervant Zorian, Dhiraj Pradhan - On-Line Testing for VLSI, Inbunden

On-Line Testing for VLSI

Av Michael Nicolaidis, Yervant Zorian, Dhiraj Pradhan

Inbunden, Engelska, 1998

1 399 kr

Skickas inom 7-10 vardagar
Shi-Yu Huang, Kwang-Ting (Tim) Cheng - Formal Equivalence Checking and Design Debugging, Inbunden
Del 12 - Frontiers in Electronic Testing

Formal Equivalence Checking and Design Debugging

Av Shi-Yu Huang, Kwang-Ting (Tim) Cheng

Inbunden, Engelska, 1998

2 499 kr

Skickas inom 7-10 vardagar
John W. Sheppard, William R. Simpson - Research Perspectives and Case Studies in System Test and Diagnosis, Inbunden
Del 13 - Frontiers in Electronic Testing

Research Perspectives and Case Studies in System Test and Diagnosis

Av John W. Sheppard, William R. Simpson

Inbunden, Engelska, 1998

2 099 kr

Skickas inom 7-10 vardagar
Angela Krstic, Kwang-Ting (Tim) Cheng - Delay Fault Testing for VLSI Circuits, Inbunden
Del 14 - Frontiers in Electronic Testing

Delay Fault Testing for VLSI Circuits

Av Angela Krstic, Kwang-Ting (Tim) Cheng

Inbunden, Engelska, 1998

2 099 kr

Skickas inom 7-10 vardagar
Benoit Nadeau-Dostie - Design for AT-Speed Test, Diagnosis and Measurement, Inbunden
Del 15 - Frontiers in Electronic Testing

Design for AT-Speed Test, Diagnosis and Measurement

Av Benoit Nadeau-Dostie

Inbunden, Engelska, 1999

2 099 kr

Skickas inom 7-10 vardagar
Adam Osseiran - Analog and Mixed-Signal Boundary-Scan, Inbunden
Del 16 - Frontiers in Electronic Testing

Analog and Mixed-Signal Boundary-Scan

Av Adam Osseiran

Inbunden, Engelska, 1999

2 099 kr

Skickas inom 7-10 vardagar
F.P.M. Beenker, R.G. Bennetts, A.P. Thijssen, F. P. M. Beenker, R. G. Bennetts, Frans Beenker, Roger Bennetts, A. P. Thijssen - Testability Concepts for Digital ICs, Inbunden
Del 3 - Frontiers in Electronic Testing

Testability Concepts for Digital ICs

Av F.P.M. Beenker, R.G. Bennetts, A.P. Thijssen, F. P. M. Beenker, R. G. Bennetts, Frans Beenker, Roger Bennetts, A. P. Thijssen

Inbunden, Engelska, 1995

2 099 kr

Skickas inom 7-10 vardagar
Xinghao Chen, Michael L. Bushnell - Efficient Branch and Bound Search with Application to Computer-Aided Design, Inbunden
Del 4 - Frontiers in Electronic Testing

Efficient Branch and Bound Search with Application to Computer-Aided Design

Av Xinghao Chen, Michael L. Bushnell

Inbunden, Engelska, 1995

1 399 kr

Skickas inom 7-10 vardagar
Jitendra B. Khare, Wojciech Maly - From Contamination to Defects, Faults and Yield Loss, Inbunden
Del 5 - Frontiers in Electronic Testing

From Contamination to Defects, Faults and Yield Loss

Av Jitendra B. Khare, Wojciech Maly

Inbunden, Engelska, 1996

1 399 kr

Skickas inom 7-10 vardagar
Yervant Zorian - Multi-Chip Module Test Strategies, Inbunden

Multi-Chip Module Test Strategies

Av Yervant Zorian

Inbunden, Engelska, 1997

1 399 kr

Skickas inom 7-10 vardagar
Wolfgang Kunz, Dominik Stoffel - Reasoning in Boolean Networks, Inbunden
Del 9 - Frontiers in Electronic Testing

Reasoning in Boolean Networks

Av Wolfgang Kunz, Dominik Stoffel

Inbunden, Engelska, 1997

2 159 kr

Skickas inom 7-10 vardagar
S. Chakravarty, Paul J. Thadikaran - Introduction to IDDQ Testing, Inbunden
Del 8 - Frontiers in Electronic Testing

Introduction to IDDQ Testing

Av S. Chakravarty, Paul J. Thadikaran

Inbunden, Engelska, 1997

1 399 kr

Skickas inom 7-10 vardagar
Dimitris Gizopoulos, A. Paschalis, Yervant Zorian - Embedded Processor-Based Self-Test, Inbunden
Del 28 - Frontiers in Electronic Testing

Embedded Processor-Based Self-Test

Av Dimitris Gizopoulos, A. Paschalis, Yervant Zorian

Inbunden, Engelska, 2004

2 099 kr

Skickas inom 7-10 vardagar
Erik Larsson - Introduction to Advanced System-on-Chip Test Design and Optimization, Inbunden
Del 29 - Frontiers in Electronic Testing

Introduction to Advanced System-on-Chip Test Design and Optimization

Av Erik Larsson

Inbunden, Engelska, 2005

2 099 kr

Skickas inom 7-10 vardagar
Charles E. Stroud - Designer’s Guide to Built-In Self-Test, Inbunden
Del 19 - Frontiers in Electronic Testing

Designer’s Guide to Built-In Self-Test

Av Charles E. Stroud

Inbunden, Engelska, 2002

2 779 kr

Skickas inom 7-10 vardagar
Vikram Iyengar, Anshuman Chandra - Test Resource Partitioning for System-on-a-Chip, Inbunden
Del 20 - Frontiers in Electronic Testing

Test Resource Partitioning for System-on-a-Chip

Av Vikram Iyengar, Anshuman Chandra

Inbunden, Engelska, 2002

1 399 kr

Skickas inom 7-10 vardagar
Krishnendu Chakrabarty - SOC (System-on-a-Chip) Testing for Plug and Play Test Automation, Inbunden
Del 21 - Frontiers in Electronic Testing

SOC (System-on-a-Chip) Testing for Plug and Play Test Automation

Av Krishnendu Chakrabarty

Inbunden, Engelska, 2002

1 399 kr

Skickas inom 7-10 vardagar
Nicola Nicolici, Bashir M. Al-Hashimi - Power-Constrained Testing of VLSI Circuits, Inbunden

Power-Constrained Testing of VLSI Circuits

Av Nicola Nicolici, Bashir M. Al-Hashimi

Inbunden, Engelska, 2003

1 399 kr

Skickas inom 7-10 vardagar
R. Dean Adams - High Performance Memory Testing, Inbunden

High Performance Memory Testing

Av R. Dean Adams

Inbunden, Engelska, 2002

2 099 kr

Skickas inom 7-10 vardagar