Multi-Chip Module Test Strategies

Inbunden, Engelska, 1997

1 409 kr

Beställningsvara. Skickas inom 10-15 vardagar

Fri frakt för medlemmar vid köp för minst 249 kr.

Multi-chips modules (MCMs) in the late 1990s consist of complex and dense VLSI devices mounted into packages that allow little physical access to internal nodes. The complexity and cost associated with their test and diagnosis are major obstacles to their use. This volume of research presents updated test strategies for MCMs. It is designed for engineers interested in practical implementations of MCM test solutions and for designers seeking current test and design-for-testability solutions for their next designs.

Produktinformation

Utgivningsdatum1997-05-31
Mått203 x 254 x 14 mm
Vikt525 g
FormatInbunden
SpråkEngelska
SerieFrontiers in Electronic Testing
Antal sidor167
FörlagKluwer Academic Publishers
ISBN9780792399209

Tillhör följande kategorier

Fundamentals of MCM Testing and Design-for-Testability.- Die Level Testing.- Known Good Die.- Substrate Testing.- A Survey of Test Techniques for MCM Substrates.- Smart Substrate MCMs.- Electron Beam Probing—A Solution for MCM Test and Failure Analysis.- Module Level Test.- MCM Test Strategy Synthesis from Chip Test and Board Test Approaches.- Designing “Dual Personality” IEEE 1149.1 Compliant Multi-Chip Modules.- An Effective Multi-Chip BIST Scheme.- MCM Test Applications.- Design-for-Test in a Multiple Substrate Multichip Module.- A Test Methodology for High Performance MCMs.- Module Level Diagnosis.- A Formalization of the IEEE 1149.1-1990 Diagnostic Methodology as Applied to Multichip Modules.- Multichip Module Diagnosis by Product-Code Signatures.- Simulation Techniques for MCMs.- Simulation Techniques for the Manufacturing Test of MCMs.- MCM Test Economics.- Economic Analysis of Test Process Flows for Multichip Modules Using Known Good Die.