Ernest Y. (IBM) Wu - Böcker
Visar alla böcker från författaren Ernest Y. (IBM) Wu.
1 produkt
1 produkt
Del 12 - IEEE Press Series on Microelectronic Systems
Reliability Wearout Mechanisms in Advanced CMOS Technologies
Av Alvin W. Strong, Ernest Y. Wu, Rolf-Peter Vollertsen, Jordi Sune, Giuseppe La Rosa, Timothy D. Sullivan, Stewart E. Rauch, Alvin W. (IBM) Strong, Ernest Y. (IBM) Wu, Rolf-Peter (Infineon) Vollertsen, Spain) Sune, Jordi (Universitat Autonoma de Barcelona, Giuseppe (IBM) La Rosa, Timothy D. (IBM) Sullivan, Alvin W Strong, Ernest Y Wu, Timothy D Sullivan, Stewart E Rauch
Inbunden, Engelska, 2009
2 709 kr
Skickas inom 5-8 vardagar