Vetenskap & teknik
Scanning Electron Microscopy and X-Ray Microanalysis
Joseph Goldstein • Dale E Newbury • David C Joy • Charles E Lyman • Patrick Echlin
Inbunden
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This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.
- Illustratör: 5 colour pl
- Format: Inbunden
- ISBN: 9780306472923
- Språk: Engelska
- Antal sidor: 689
- Utgivningsdatum: 2007-04-01
- Förlag: Kluwer Academic/Plenum Publishers